?? scutest.c
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#include <psos.h>
#include "board.h"
#include "bspcomm.h"
#include "bspspec.h"
#include "scutest.h"
static ULONG TestTaskID, TestQueID;
static volatile int FNCount, TicksCount, GPriority;
static volatile char pSendBuf[MAX_TEST_BUF_LEN], pRecvBuf[MAX_TEST_BUF_LEN];
static void (*pCallback)(int cmd, void *param, int len);
int TestTaskInit(int priority, void (*callback)(int cmd, void *param, int len))
{
volatile int rc;
GPriority = priority;
if(callback == NULL)
return SDE_FAIL;
pCallback = callback;
rc = q_create("TstQ", 20, Q_LOCAL|Q_PRIOR|Q_LIMIT|Q_PRIBUF, &TestQueID);
if(rc != 0){
return SDE_CREATE_QUEUE_FAIL;
}
rc = CreateTask("TstT", TestTask, &TestTaskID, GPriority, 0);
if(rc != 0){
return SDE_CREATE_TASK_FAIL;
}
return SDE_OK;
}
void TestTaskCmd(int cmd, void *param, int len)
{
int i;
ULONG QSendMsgBuf[4];
QSendMsgBuf[0] = cmd;
QSendMsgBuf[1] = (ULONG)param;
QSendMsgBuf[2] = len;
q_send(TestQueID, QSendMsgBuf);
}
static void TestTask(void)
{
int i;
volatile int rc;
TestStruct Ti, To;
SDCEventQueueStruct eq;
TestRsltStruct tr;
CommTestRsltStruct ctr;
ULONG QRecvMsgBuf[4];
while (1) {
if(q_receive(TestQueID, Q_WAIT, 0, QRecvMsgBuf) != 0) {
tm_wkafter(1);
continue;
}
Ti.cmd = QRecvMsgBuf[0];
Ti.param = (void *)QRecvMsgBuf[1];
Ti.len = QRecvMsgBuf[2];
memset(&tr, 0, sizeof(TestRsltStruct));
memset(&ctr, 0, sizeof(CommTestRsltStruct));
switch(Ti.cmd){
case SDC_MT8980_TEST:
rc = sd_cntrl(SDN_MT8980, SDC_SET_TEST_MODE, 0, 0);
if(Ti.len < sizeof(CommTestStruct)){
ctr.WrTest = SDE_FAIL;
ctr.OnLineTest = SDE_FAIL;
ctr.FacTest = SDE_FAIL;
ctr.ErrInfo[0] = SDE_INVALID_ARG;
}
else
MT8980Test(Ti.param, &ctr);
To.cmd = Ti.cmd;
To.param = &ctr;
To.len = sizeof(CommTestRsltStruct);
rc = sd_cntrl(SDN_MT8980, SDC_SET_UNTEST_MODE, 0, 0);
break;
case SDC_NIU_TEST:
rc = sd_cntrl(SDN_NIU, SDC_SET_TEST_MODE, 0, 0);
if(Ti.len < sizeof(CommTestStruct)){
ctr.WrTest = SDE_FAIL;
ctr.OnLineTest = SDE_FAIL;
ctr.FacTest = SDE_FAIL;
ctr.ErrInfo[0] = SDE_INVALID_ARG;
}
else
NiuTest(Ti.param, &ctr);
To.cmd = Ti.cmd;
To.param = &ctr;
To.len = sizeof(CommTestRsltStruct);
rc = sd_cntrl(SDN_NIU, SDC_SET_UNTEST_MODE, 0, 0);
break;
case SDC_SPI_TEST:
rc = sd_cntrl(SDN_SPI, SDC_SET_TEST_MODE, &eq, sizeof(SDCEventQueueStruct));
SpiTest(&tr);
To.cmd = Ti.cmd;
To.param = &tr;
To.len = sizeof(TestRsltStruct);
rc = sd_cntrl(SDN_SPI, SDC_SET_UNTEST_MODE, &eq, sizeof(SDCEventQueueStruct));
break;
case SDC_HPI_TEST:
HpiTest(&tr);
To.cmd = Ti.cmd;
To.param = &tr;
To.len = sizeof(TestRsltStruct);
break;
case SDC_FLASH_TEST:
rc = sd_cntrl(SDN_FLASH, SDC_SET_TEST_MODE, 0, 0);
FlashTest(&tr);
To.cmd = Ti.cmd;
To.param = &tr;
To.len = sizeof(TestRsltStruct);
rc = sd_cntrl(SDN_FLASH, SDC_SET_UNTEST_MODE, 0, 0);
break;
case SDC_DS1620_TEST:
rc = sd_cntrl(SDN_DS1620A, SDC_SET_TEST_MODE, 0, 0);
rc = sd_cntrl(SDN_DS1620B, SDC_SET_TEST_MODE, 0, 0);
rc = sd_cntrl(SDN_DS1620C, SDC_SET_TEST_MODE, 0, 0);
rc = sd_cntrl(SDN_DS1620D, SDC_SET_TEST_MODE, 0, 0);
DS1620Test(&tr);
To.cmd = Ti.cmd;
To.param = &tr;
To.len = sizeof(TestRsltStruct);
rc = sd_cntrl(SDN_DS1620A, SDC_SET_UNTEST_MODE, 0, 0);
rc = sd_cntrl(SDN_DS1620B, SDC_SET_UNTEST_MODE, 0, 0);
rc = sd_cntrl(SDN_DS1620C, SDC_SET_UNTEST_MODE, 0, 0);
rc = sd_cntrl(SDN_DS1620D, SDC_SET_UNTEST_MODE, 0, 0);
break;
case SDC_ALARMS_TEST:
AlarmsTest(&tr);
To.cmd = Ti.cmd;
To.param = &tr;
To.len = sizeof(TestRsltStruct);
break;
case SDC_FN_TEST:
FNTest(&tr);
To.cmd = Ti.cmd;
To.param = &tr;
To.len = sizeof(TestRsltStruct);
break;
default:
break;
}
pCallback(To.cmd, To.param, To.len);
}
}
static int CreateTask(char *name,void (*task)(void), ULONG *tid, int priority, ULONG *p)
{
volatile int rc;
rc = t_create(name, priority, SCUTEST_TASK_SSTACK_SIZE, SCUTEST_TASK_USTACK_SIZE, 0, tid);
if (rc != 0)
return rc;
rc = t_start(*tid, T_SUPV|T_PREEMPT|T_TSLICE, task, p);
if (rc != 0) { t_delete(*tid); return rc; }
return 0;
}
static void NiuTest(CommTestStruct *pct, CommTestRsltStruct *pctr)
{
int i;
NiuTestStruct nt;
NiuTestStruct nr;
volatile int rc, ErrCount=0;
nt.Niu0 = 1;
nt.Niu1 = 1;
nt.ParamLen = sizeof(NiuTestStruct);
if(pct->WrTest == 1){
nr.Niu0 = -1;
nr.Niu1 = -1;
nr.ParamLen = sizeof(NiuTestStruct);
rc = NiuChipWRTest(&nt, &nr);
if(rc == SDE_NIU_MODE_ERROR){
pctr->WrTest = SDE_FAIL;
pctr->ErrInfo[ErrCount++] = SDE_NIU_MODE_ERROR;
}
else{
pctr->WrTest = ((nr.Niu0==SDE_OK)&&(nr.Niu1==SDE_OK))?SDE_OK:SDE_FAIL;
if(pctr->WrTest == SDE_FAIL){
if(nr.Niu0 == SDE_FAIL)
pctr->ErrInfo[ErrCount++] = SDE_NIU0_WR_FAIL;
if(nr.Niu1 == SDE_FAIL)
pctr->ErrInfo[ErrCount++] = SDE_NIU1_WR_FAIL;
}
}
}
if(pct->OnLineTest == 1){
nr.Niu0 = -1;
nr.Niu1 = -1;
nr.ParamLen = sizeof(NiuTestStruct);
rc = NiuLoopTest(&nt, &nr, INLOOP);
if(rc == SDE_NIU_MODE_ERROR){
pctr->OnLineTest = SDE_FAIL;
pctr->ErrInfo[ErrCount++] = SDE_NIU_MODE_ERROR;
}
else{
pctr->OnLineTest = ((nr.Niu0==SDE_OK)&&(nr.Niu1==SDE_OK))?SDE_OK:SDE_FAIL;
if(pctr->OnLineTest == SDE_FAIL){
if(nr.Niu0 == SDE_FAIL)
pctr->ErrInfo[ErrCount++] = SDE_NIU0_ONLINE_TEST_FAIL;
if(nr.Niu1 == SDE_FAIL)
pctr->ErrInfo[ErrCount++] = SDE_NIU1_ONLINE_TEST_FAIL;
}
}
}
if(pct->FacTest == 1){
nr.Niu0 = -1;
nr.Niu1 = -1;
nr.ParamLen = sizeof(NiuTestStruct);
rc = NiuLoopTest(&nt, &nr, EXLOOP);
if(rc == SDE_NIU_MODE_ERROR){
pctr->FacTest = SDE_FAIL;
pctr->ErrInfo[ErrCount++] = SDE_NIU_MODE_ERROR;
}
else{
pctr->FacTest = ((nr.Niu0==SDE_OK)&&(nr.Niu1==SDE_OK))?SDE_OK:SDE_FAIL;
if(pctr->FacTest == SDE_FAIL){
if(nr.Niu0 == SDE_FAIL)
pctr->ErrInfo[ErrCount++] = SDE_NIU0_FAC_TEST_FAIL;
if(nr.Niu1 == SDE_FAIL)
pctr->ErrInfo[ErrCount++] = SDE_NIU1_FAC_TEST_FAIL;
}
}
}
}
static void MT8980Test(CommTestStruct *pct, CommTestRsltStruct *pctr)
{
TSTestStruct tsc,tsr;
volatile int rc;
if(pct->WrTest == 1){
pctr->WrTest = (MT8980ChipWRTest()==SDE_OK)?SDE_OK:SDE_FAIL;
}
if(pct->OnLineTest == 1){
tsc.ts0 = 0;
tsc.ts1 = 1;
tsc.ts2 = 1;
tsc.ParamLen = sizeof(TSTestStruct);
tsr.ts0 = -1;
tsr.ts1 = -1;
tsr.ts2 = -1;
tsr.ParamLen = sizeof(TSTestStruct);
rc = MT8980LoopTest(&tsc, &tsr);
pctr->OnLineTest = ((tsr.ts1==SDE_OK)&&(tsr.ts2==SDE_OK))?SDE_OK:SDE_FAIL;
}
if(pct->FacTest == 1){
tsc.ts0 = 1;
tsc.ts1 = 1;
tsc.ts2 = 1;
tsc.ParamLen = sizeof(TSTestStruct);
tsr.ts0 = -1;
tsr.ts1 = -1;
tsr.ts2 = -1;
tsr.ParamLen = sizeof(TSTestStruct);
rc = MT8980LoopTest(&tsc, &tsr);
pctr->FacTest = ((tsr.ts0==SDE_OK)&&(tsr.ts1==SDE_OK)&&(tsr.ts2==SDE_OK))?SDE_OK:SDE_FAIL;
}
}
static void HpiTest(TestRsltStruct *ptr)
{
int i, j, DspNum, MaxDspNum, TestBlocks=10, RamBlock=10, ErrCount=0, ErrCount0;
ULONG RetValue, WriteRam[10], ReadRam[10];
MaxDspNum = (IsBPU2Installed()==TRUE)?4:2;
for(DspNum = 0; DspNum < MaxDspNum; DspNum++) {
ErrCount0 = 0;
HPIReset(DspNum);
HPIWriteULONG(DspNum, 0x80000002, 0x77777777);
RetValue = HPIReadULONG(DspNum, 0x80000002);
if(RetValue != 0x77777777) {
ErrCount0++;
}
for(i = 0; i < TestBlocks; i++) {
for (j = 0; j < RamBlock; j++)
WriteRam[j] = (char)rand();
HPIWriteRam(DspNum, i * RamBlock+0x80000000, RamBlock, WriteRam);
HPIReadRam(DspNum, i * RamBlock+0x80000000, RamBlock, ReadRam);
if(memcmp(WriteRam, ReadRam, RamBlock*4) != 0)
ErrCount0++;
}
if(ErrCount0 != 0)
ptr->ErrInfo[ErrCount++] = SDE_DSP0_FAIL - DspNum;
HPIRunning(DspNum);
}
ptr->TestRslt = (ErrCount==0)?SDE_OK:SDE_FAIL;
}
static void SpiTest(TestRsltStruct *ptr)
{
volatile int rc;
int i, Slave, OpCodeRead, OpCodeWrite, TestByte=10, ErrCount0, ErrCount=0, CurDev;
char pData[20], WriteValue;
CurDev = SDN_SPI;
tm_wkafter(2);
for(i = 0; i < 16; i++){ /* clear receive buffer */
rc = sd_read(CurDev, pRecvBuf, MAX_TEST_BUF_LEN);
if(rc == SDE_BUF_EMPTY) break;
}
for(Slave = 0; Slave < 2; Slave++){
ErrCount0 = 0;
rc = sd_cntrl(CurDev, SDC_SEL_SLAVE, &Slave, sizeof(int));
rc = sd_cntrl(CurDev, SDC_PROGRAM_MODE, &Slave, sizeof(int));
tm_wkafter(100);
for (i = 1024; i < 1024 + TestByte; i++){
/* program enable */
rc = sd_cntrl(CurDev, SDC_SEL_SLAVE, &Slave, sizeof(int));
pData[0] = pData[1] = 0xAC;
pData[2] = pData[3] = 0x53;
pData[4] = pData[5] = 0x00;
rc = sd_write(CurDev, pData, 6);
tm_wkafter(2);
rc = sd_read(CurDev, pRecvBuf, 6);
if(i >= 0 && i <= 255) OpCodeRead = 0x05; /* data: 0x05; code : 0x01 */
else if (i >= 256 && i <= 511) OpCodeRead = 0x0d; /* data: 0x0d; code : 0x09 */
else if (i >= 512 && i <= 1023) OpCodeRead = 0x15; /* data: 0x15; code : 0x11 */
else if (i >= 1024 && i <= 2047) OpCodeRead = 0x25;/* data: 0x25; code : 0x21 */
OpCodeWrite = OpCodeRead + 1;
/* write data memory */
rc = sd_cntrl(CurDev, SDC_SEL_SLAVE, &Slave, sizeof(int));
pData[0] = pData[1] = OpCodeWrite;
pData[2] = pData[3] = i % 256;
pData[4] = pData[5] = WriteValue = (char)rand();
rc = sd_write(CurDev, pData, 6);
tm_wkafter(2);
rc = sd_read(CurDev, pRecvBuf, 6);
/* read data memory */
rc = sd_cntrl(CurDev, SDC_SEL_SLAVE, &Slave, sizeof(int));
pData[0] = pData[1] = OpCodeRead;
pData[2] = pData[3] = i % 256;
pData[4] = pData[5] = 0x00;
rc = sd_write(CurDev, pData, 6);
tm_wkafter(4);
rc = sd_read(CurDev, pRecvBuf, 6);
if(pRecvBuf[4] != WriteValue)
ErrCount0++;
}
if(ErrCount0 != 0)
ptr->ErrInfo[ErrCount++] = SDE_RFIU0_FAIL - Slave;
rc = sd_cntrl(CurDev, SDC_CLOSE, &Slave, sizeof(int));
rc = sd_cntrl(CurDev, SDC_RUN, &Slave, sizeof(int));
}
ptr->TestRslt = (ErrCount==0)?SDE_OK:SDE_FAIL;
}
static int MT8980ChipWRTest(void)
{
int i, j, ErrCount=0;
char ReadVal, WriteVal;
for (i = 0; i < 8; i++) {
WriteVal = (0x18 | (i & 0x7));
REG8(MT8980_BASE) = WriteVal; /* Conn Mem High(11) */
ReadVal = REG8(MT8980_BASE);
if(ReadVal != WriteVal)
ErrCount++;
for (j = 0; j < 32; j++) {
WriteVal = 0x1;
REG8(MT8980_BASE + 0x20 + j) = WriteVal;
ReadVal = REG8(MT8980_BASE + 0x20 + j);
if(ReadVal != WriteVal)
ErrCount++;
}
WriteVal = (0x10 | (i & 0x7));
REG8(MT8980_BASE) = WriteVal; /* Conn Mem Low(10) */
ReadVal = REG8(MT8980_BASE);
if(ReadVal != WriteVal)
ErrCount++;
for (j = 0; j < 32; j++) {
WriteVal = j;
REG8(MT8980_BASE + 0x20 + j) = WriteVal;
ReadVal = REG8(MT8980_BASE + 0x20 + j);
if(ReadVal != WriteVal)
ErrCount++;
}
}
return (ErrCount==0)?SDE_OK:SDE_FAIL;
}
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