//****************************************************************************
// 
// Faraday Technology Coporation 
// Copyright (C) Microsoft Corporation. All rights reserved.
//                                
//*--------------------------------------------------------------------------*
//* Name:I2C_test.h                                                          *
//* Description: I2C test definitions                                        *
//* Author: Shawn, Hsiao                                                     *
//* Date: 2006/08/07                                                         *
//* Version:0.1	                                                             *
//* Note: modified from old burn-In                                          *
//****************************************************************************

#ifndef BURNIN_I2C_H_INCLUDE
#define BURNIN_I2C_H_INCLUDE

//============================================================================
//        Include
//============================================================================

#include "fLib.h"

//============================================================================
//        Definition
//============================================================================

/* device
*/
#define DEVICE_ADDR			0xa8 //serial eeprom
#define READ_DEVICE 		(DEVICE_ADDR+1)
#define WRITE_DEVICE		DEVICE_ADDR

/* controller
*/
#define I2C_GSR_Value		0x01
#define I2C_TSR_Value		0x20
#define I2C_CDR_Value		0x50 //*2 //ivan For CPE120
//
// 400K = PCLK/2*(count+1)
//

//============================================================================
//        Functions
//============================================================================

int I2CTest(void);
void I2C_Isr(void);
UINT32 ByteWriteTest1(void);
UINT32 ByteWriteTest2(void);
UINT32 PageWriteTest1(void);
UINT32 PageWriteTest2(void);
void ByteWrite(UINT32 waddr,UINT32 wdata);
void PageWrite(UINT32 addr);
UINT32 RandomRead(UINT32 raddr);

#endif //BURNIN_I2C_H_INCLUDE