About the Tests---------------The following tests are from the original version, updated simply for speedand rewritten to fit the new framework of the program.  These tests willmainly catch memory errors due to bad bits which are permanently stuck highor low:  Random value  XOR comparison  SUB comparison  MUL comparison  DIV comparison  OR comparison  AND comparison  The following tests were implemented by me, and will do a slightly better jobof catching flaky bits, which may or may not hold a true value:  Sequential Increment  Block Sequential  Solid BitsThe remaining tests were also implemented by me, and are designed to catchbad bits which are dependent on the current values of surrounding bits in eitherthe same word32, or in the preceding and succeeding word32s.  Bit Flip  Checkerboard  Walking Ones  Walking Zeroes  Bit SpreadThere is also a test (Stuck Address) which is run first.  It determines if the memory locations the program attempts to access are addressed properly or not.  If this test reports errors, there is almost certainly a problem somewhere in the memory subsystem.  Results from the rest of the tests cannot be considered accurate if this test fails:  Stuck AddressUsage information is summarized in the file ABOUT, and in the man page.