介紹了一種基于C8051F020單片機的多路壓力測量儀。該測量儀選用電阻應變式壓力傳感器采集壓力信號，并經放大電路處理后送入C8051F020單片機，再由C8051F020單片機內部的A/D轉換器將采集到的壓力信號進行模數轉化，然后分別對數據進行存儲和顯示。該測量儀能測量6路壓力信號，并且各測量點都能單獨檢測和設置。由于采用了C8051F020單片機，簡化了硬件電路，增強了抗干擾能力，使得測量儀具有測量精度高，沖擊小等特點。 Abstract: A measurement apparatus for multi-channel pressure based on single chip microcomputer is introduced.It can measure 6 channels signal of the pressure，and the pressure measure points can be detection and located individually.The pressure signal sampling is obtained by resistor stress-type pressure sensors，the digital signals of 6 channels are collected through amplifying and adjustment circuit of pressure signals and internal integrated A/D converter of MCU.Finally，and it realizes the function to store and display data separately.C8051F020 was used to made hardware circuit simple，and it also enhanced the anti-interference ability.It features high precision and little impact.
上傳時間： 2013-11-16
上傳用戶：yare
量測/測試所面臨之問題 此測試驗證上，要使用NI公司之LAB VIEW及DAQ CARD來取代AUDIO PRECISION及其所附軟體ATS。首先需克服硬體解析度上的差異，再來是FFT（FAST FOURIER TRANSFORM,快速傳立業轉換）演算未予的撰寫，這將會影響MULTI-TONE訊號上PEAK值的偵測。另外，以RS-232為I/O介面，并呼叫客戶所提供之DLL檔來與DUT內的IC溝通，但因LAB VIEW無法直接呼叫其STRUCTURE，故需用VC++再編譯一層新的DLL來供LAB VIEW使用。
上傳時間： 2013-12-13
上傳用戶：longlong12345678
針對當前安檢力學試驗機所能完成的試驗種類單一、自動化程度低等問題，提出一種以ATmega128單片機為核心控制器的安檢力學試驗機的設計。詳細闡述了該安檢力學試驗機各個組成部分的設計原理和方案，并且給出了各部分的軟件設計思想和操作流程。經過大量測試試驗表明：設計的安檢力學試驗機可以完成多達十余種的力學安檢試驗，完全符合相關國家標準，并且具有數據采集精度高、傳輸速度快、操作安全簡便等特點，實現了安檢設備的多功能化、數字化和自動化。 Abstract: Currently， many mechanical security testing machines have only one function. The degree of automation of them is low. To solve those problems， a new kind of mechanical security testing machine， using ATmega128 micro-controller as its core controller， has been advanced. It describes the components of the machine. The principles and the scheme in the designing processes are presented in detail， and the software architecture and the operation processes of each part are given. After having done many testing， we have reached the following conclusions: the mechanical security testing machine presented can do over ten mechanical security tests complying with related national standards. It has high data acquisition accuracy and high transmission speed. The operation of the machine is simple and safe. In general， this machine is a multi-functional， highly automatic， digitalized security testing device.
上傳時間： 2013-11-05
上傳用戶：a67818601
介紹了用單片機C 語言實現無功補償中電容組循環投切的基本原理和算法，并舉例說明。關鍵詞：循環投切;C51;無功補償中圖分類號： TM76 文獻標識碼： BAbstract: This paper introduces the aplication of C51 in the controlling of capacitorsuits cycle powered to be on and off in reactive compensation.it illustrate thefondamental principle and algorithm with example.Key words: cycle powered to be on and off; C51; reactive compensation 為提高功率因數，往往采用補償電容的方法來實現。而電容器的容量是由實時功率因數與標準值進行比較來決定的，實時功率因數小于標準值時，需投入電容組，實時功率因數大于標準值時，則需切除電容組。投切方式的不合理，會對電容器造成損壞，現有的控制器多采用“順序投切”方式，在這種投切方式下排序在前的電容器組，先投后切；而后面的卻后投先切。這不僅使處于前面的電容組經常處于運行狀態，積累熱量不易散失，影響其使用壽命，而且使后面的投切開關經常動作，同樣減少壽命。合理的投切方式應為“循環投切”。這種投切方式使先投入的運行的電容組先退出，后投的后切除，從而使各組電容及投切開關使用機率均等，降低了電容組的平均運行溫度，減少了投切開關的動作次數，延長了其使用壽命。
上傳時間： 2014-12-27
上傳用戶：hopy
keil c51 v9.01此版不是漢化中文版，是英文版來的。ARM發布Keil μVision4集成開發環境(IDE)，用來在微控制器和智能卡設備上創建、仿真和調試嵌入式應用。 μVision4 IDE是為增強開發人員的工作效率設計的，有了它可以更快速、更高效地開發和檢驗程序。通過μVision4 IDE中引入的靈活的窗口管理系統，開發人員可以使用多臺監視器，在可視界面任何地方全面控制窗口放置。 新用戶界面可以更好地利用屏幕空間，更有效地組織多個窗口，為開發應用提供整齊高效的環境。 μVision4在μVision3的成功經驗的基礎上增加了：* System Viewer (系統查看程序)窗口，提供了設備外圍寄存器信息，這些信息可以在System Viewer窗口內部直接更改。* Debug Restore Views (調試恢復視圖)允許保存多個窗口布局，為程序分析迅速選擇最適合的調試視圖。* Multi-Project Workspace(多項目工作空間)為處理多個并存的項目提供了簡化的方法，如引導加載程序和應用程序。* 為基于ARM Cortex 處理器的MCU提供了Data and instruction trace(數據和指令追蹤)功能。* 擴展了Device Simulation(設備仿真)功能以支持許多新設備，如Luminary、NXP和東芝生產的基于ARM Cortex-M3處理器的MCU；Atmel SAM7/9；及新的8051衍生品，如Infineon XC88x和SiLABS 8051Fxx。* 支持許多debug adapter interfaces(調試適配器接口)，包括ADI miDAS Link、Atmel SAM-ICE、Infineon DAS和ST-Link。
上傳時間： 2013-10-31
上傳用戶：qingdou
NEC 16位MCU參考手冊 The 78K0R/IC3 is a 16-bit single-chip microcontroller that uses a 78K0R CPU core and incorporates peripheral functions, such as ROM/RAM, a multi-function timer, a multi-function serial interface, an A/D converter, a programmable gain amplifier (PGA), a comparator, a real-time counter, and a watchdog timer.
上傳時間： 2013-11-02
上傳用戶：努力努力再努力
The CAT28LV64 is a low voltage, low power, CMOS Parallel EEPROM organized as 8K x 8−bits. It requires a simple interface for in−system programming. On−chip address and data latches, self−timed write cycle with auto−clear and VCC power up/down write protection eliminate additional timing and protection hardware. DATA Polling and Toggle status bit signal the start and end of the self−timed write cycle. Additionally, the CAT28LV64 features hardware and software write protection.
上傳時間： 2013-11-16
上傳用戶：浩子GG
The Controller Area Network (CAN) is a serial, asynchronous, multi-master communication protocol forconnecting electronic control modules, sensors and actuators in automotive and industrial applications.With the SJA1000, Philips Semiconductors provides a stand-alone CAN controller which is more than a simpleeplacement of the PCA82C200.Attractive features are implemented for a wide range of applications, supporting system optimization, diagnosisand maintenance.
標簽： Stand-alone contro 1000 SJA
上傳時間： 2013-11-18
上傳用戶：yxgi5
This application note shows how to write an Inter Integrated Circuit bus driver (I²C) for the Philips P90CL301micro-controller.It is not only an example of writing a driver, but it also includes a set of application interface software routines toquickly implement a complete I²C multi-master system application.For specific applications the user will have to make minimal changes in the driver program. Using the drivermeans linking modules to your application software and including a header-file into the application sourceprograms. A small example program of how to use the driver is listed.The driver supports i.a. polled or interrupt driven message handling, slave message transfers and multi-mastersystem applications. Furthermore, it is made suitable for use in conjunction with real time operating systems, likepSOS+.
上傳時間： 2013-11-23
上傳用戶：weixiao99
All inputs of the C16x family have Schmitt-Trigger input characteristics. These Schmitt-Triggers are intended to always provide proper internal low and high levels, even if anundefined voltage level (between TTL-VIL and TTL-VIH) is externally applied to the pin.The hysteresis of these inputs, however, is very small, and can not be properly used in anapplication to suppress signal noise, and to shape slow rising/falling input transitions.Thus, it must be taken care that rising/falling input signals pass the undefined area of theTTL-specification between VIL and VIH with a sufficient rise/fall time, as generally usualand specified for TTL components (e.g. 74LS series: gates 1V/us, clock inputs 20V/us).The effect of the implemented Schmitt-Trigger is that even if the input signal remains inthe undefined area, well defined low/high levels are generated internally. Note that allinput signals are evaluated at specific sample points (depending on the input and theperipheral function connected to it), at that signal transitions are detected if twoconsecutive samples show different levels. Thus, only the current level of an input signalat these sample points is relevant, that means, the necessary rise/fall times of the inputsignal is only dependant on the sample rate, that is the distance in time between twoconsecutive evaluation time points. If an input signal, for instance, is sampled throughsoftware every 10us, it is irrelevant, which input level would be seen between thesamples. Thus, it would be allowable for the signal to take 10us to pass through theundefined area. Due to the sample rate of 10us, it is assured that only one sample canoccur while the signal is within the undefined area, and no incorrect transition will bedetected. For inputs which are connected to a peripheral function, e.g. capture inputs, thesample rate is determined by the clock cycle of the peripheral unit. In the case of theCAPCOM unit this means a sample rate of 400ns @ 20MHz CPU clock. This requiresinput signals to pass through the undefined area within these 400ns in order to avoidmultiple capture events.For input signals, which do not provide the required rise/fall times, external circuitry mustbe used to shape the signal transitions.In the attached diagram, the effect of the sample rate is shown. The numbers 1 to 5 in thediagram represent possible sample points. Waveform a) shows the result if the inputsignal transition time through the undefined TTL-level area is less than the time distancebetween the sample points (sampling at 1, 2, 3, and 4). Waveform b) can be the result ifthe sampling is performed more than once within the undefined area (sampling at 1, 2, 5,3, and 4).Sample points:1. Evaluation of the signal clearly results in a low level2. Either a low or a high level can be sampled here. If low is sampled, no transition willbe detected. If the sample results in a high level, a transition is detected, and anappropriate action (e.g. capture) might take place.3. Evaluation here clearly results in a high level. If the previous sample 2) had alreadydetected a high, there is no change. If the previous sample 2) showed a low, atransition from low to high is detected now.
上傳時間： 2013-10-23
上傳用戶：copu
