The challenges associated with the design and implementation of Electro- static Discharge (ESD) protection circuits become increasingly complex as technology is scaled well into nano-metric regime. One must understand the behavior of semiconductor devices under very high current densities, high temperature transients in order to surmount the nano-meter ESD challenge. As a consequence, the quest for suitable ESD solution in a given technology must start from the device level. Traditional approaches of ESD design may not be adequate as the ESD damages occur at successively lower voltages in nano-metric dimensions.
標簽： Protection Circuit Device Design ESD and
上傳時間： 2020-06-05
上傳用戶：shancjb
This book on electrostatic discharge phenomena is essentially a translation and update ofa Swedish edition from 1992. The book is intended for people working with electronic circuits and equipments, in application and development. All personnel should be aware of the ESD-hazards, especially those responsible for quality. ESD-prevention is a part of TQM (Total Quality Management). The book is also usable for courses on the subject.
標簽： Electronics Scourge ESD The of
上傳時間： 2020-06-05
上傳用戶：shancjb
Since electronic equipment was first developed, static electricity has been a source of problems for users and designers. In the last few years, however, electrostatic discharge (ESD) has become a source of major problems. This has occurred because newer electronic devices, such as integrated circuits, are much more susceptible to ESD problems than previous devices, such as vacuum tubes. Another trend compounding this ESD susceptibility problem is the spread of sophisticated equipment into home and office environments where ESD is quite common.
標簽： Electronic Equipment ESD and
上傳時間： 2020-06-05
上傳用戶：shancjb
This text, ESD Basics: From Semiconductor Manufacturing to Product Use was initiated on the need to produce a text that addresses fundamentals of electrostatic discharge from the manufacturing environment to today’s products. As the manufacturing world evolves, semi- conductor networks scale, and systems are changing, the needs and requirements for reliabi- lity and ESD protection are changing. A text is required that connects basic ESD phenomena to today’s real world environment.
上傳時間： 2020-06-05
上傳用戶：shancjb
In the field of electricity, electrostatics, and circuit theory, there are many discoveries and accomplishments that have lead to the foundation of the field of electrostatic discharge (ESD) phenomenon. Below is a chronological list of key events that moved the field of electrostatics forward:
上傳時間： 2020-06-05
上傳用戶：shancjb
ESD is a crucial factor for integrated circuits and influences their quality and reliability. Today increasingly sensitive processes with deep sub micron structures are developed. The integration of more and more functionality on a single chip and saving of chip area is required. Integrated circuits become more susceptible to ESD/EOS related damages. However, the requirements on ESD robustness especially for automotive applications are increasing. ESD failures are very often the reason for redesigns. Much research has been conducted by semiconductor manufacturers on ESD robust design.
標簽： Guidelines Design Basic ESD
上傳時間： 2020-06-05
上傳用戶：shancjb
As we enter the next millennium, there are clear technological patterns. First, the electronic industry continues to scale microelectronic structures to achieve faster devices, new devices, or more per unit area. Secondly, electrostatic charge, electrostatic discharge (ESD), electrical overstress (EOS) and electromagnetic emissions (EMI) continue to be a threat to these scaled structures. This dichotomy presents a dilemma for the scaling of semiconductor technologies and a future threat to new technologies. Technological advancements, material changes, design techniques, and simulation can fend off this growing concern – but to maintain this ever-threatening challenge, one must continue to establish research and education in this issue.
標簽： ESD-Phenomena-and-the-Reliability
上傳時間： 2020-06-05
上傳用戶：shancjb
j-link,V466 j-link,V466 j-link,V466 j-link,V466 j-link,V466 j-link,V466 j-link,V466
上傳時間： 2021-03-23
上傳用戶：koko440
設計高速電路必須考慮高速訊 號所引發的電磁干擾、阻抗匹配及串音等效應，所以訊號完整性 (signal integrity)將是考量設計電路優劣的一項重要指標，電路日異複雜必須仰賴可 靠的軟體來幫忙分析這些複雜的效應，才比較可能獲得高品質且可靠的設計， 因此熟悉軟體的使用也將是重要的研究項目之一。另外了解高速訊號所引發之 各種效應(反射、振鈴、干擾、地彈及串音等)及其克服方法也是研究高速電路 設計的重點之一。目前高速示波器的功能越來越多，使用上很複雜，必須事先 進修學習，否則無法全盤了解儀器之功能，因而無法有效發揮儀器的量測功能。 其次就是高速訊號量測與介面的一些測試規範也必須熟悉，像眼圖分析，探針 效應，抖動(jitter)測量規範及高速串列介面量測規範等實務技術，必須充分 了解研究學習，進而才可設計出優良之教學教材及教具。
標簽： 高速電路
上傳時間： 2021-11-02
上傳用戶：jiabin
華為開關電源電感器設計 正激式開關電源變壓器設計步驟
上傳時間： 2021-12-03
上傳用戶：fliang
