/*********************************************************************
 
  (c) copyright Freescale Semiconductor Hong Kong Ltd. 2002
  ALL RIGHTS RESERVED
  
 *********************************************************************
 
             Test Driver Module for S12 MCUs 
 
 *********************************************************************

  File:			test_includes.h
 
  Description:  Define my System Configuration & Compiler Options.
 
  Date:     Oct. 2004
  Author:		Derek Lau
  
 ********************************************************************/
#ifndef _TEST_INTRN_GLOBAL_DECL_
#define _TEST_INTRN_GLOBAL_DECL_ extern
#endif

#ifndef _H_TEST_INCLUDES_		// To avoid multiple defining
#define _H_TEST_INCLUDES_		// start of Constants & Macros definition

#include	"Hidef.h"

muint8 ATA_TestInit(muint8 ResetPin, volatile muint8 *ResetPort);
muint8 CF_TestInit(void);
void main(void);
void Init_System(void);
void Init_IQUE(void);
void Init_Buffer(void);
void Fill_Buffer(muint8 data, muint16 startaddr);
void Init_PLL(void);
void Test_ReadW(muint16 no_of_blk, muint8 segment, muint16 phyblk);
void SD_TestReadW(muint16 no_of_blk, muint32 lba);
void Move2QUE1(muint8 *FR_ptr, muint16 Len); 
void Test_Page_Program32(muint8 page, muint16 phyblk);
void Test_Page_Program(muint32 lba);


#pragma TRAP_PROC

void USB_StartFrameISR(void){};
void USB_PhyEP6ISR(void){};
void USB_PhyEP5ISR(void){};
void USB_PhyEP4ISR(void){};
void USB_PhyEP3ISR(void){};
void USB_PhyEP2ISR(void){};
void USB_EP0OUTISR(void){};
void USB_EP0INISR(void){};
void USB_SetConfigISR(void){};
void USB_SetupISR(void){};
void USB_StatusChgISR(void){};
#ifndef _H_SD_INCLUDES_
void SD_Irq_Interrupt(void){};
#endif

#endif	_H_Test_INCLUDES_		// end of my Constants & Macros definition
//
// The end of file test_includes.h
// *********************************************************************************