Testability is the concern most often voiced by Texas Instruments (TIä )
application specific integrated circuit (ASIC) users. This document is intended
to consolidate TI policies into a coherent approach to designing for testability.
It is not intended as a specification, but as a guide you can use for developing
test strategies when designs are being initiated
標(biāo)簽：
Testability
Instruments
application
specific
上傳時間：
2016-11-13
上傳用戶：wfl_yy
