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Probe

  • Probe PCI devices, and compare information with standard file

    Probe PCI devices, and compare information with standard file

    標簽: information standard devices compare

    上傳時間: 2014-01-07

    上傳用戶:zhuimenghuadie

  • Probe方式的1341驅(qū)動

    Probe方式的1341驅(qū)動,在2.6.11內(nèi)核測試

    標簽: Probe 1341 方式 驅(qū)動

    上傳時間: 2013-12-25

    上傳用戶:franktu

  • Lambda Probe(Tomcat Probe)是一個基于Web以實時的方式來管理單個Tomcat主機的工具。它除了具備標準Tomcat Manager大部份功能之外還提供一些能夠幫助Web開發(fā)者

    Lambda Probe(Tomcat Probe)是一個基于Web以實時的方式來管理單個Tomcat主機的工具。它除了具備標準Tomcat Manager大部份功能之外還提供一些能夠幫助Web開發(fā)者和系統(tǒng)管理員更加清楚地了解Tomcat運行情況的功能。Tomcat Probe采用XHTML1.0與CSS 2.0技術(shù)進行開發(fā)所以界面非常好看,操作很方便。

    標簽: Tomcat Probe Web Manager

    上傳時間: 2013-12-21

    上傳用戶:aeiouetla

  • Design of a Microwave Probe Fed Rectangular Micro‐strip Patch Antenna

    Design of a Microwave Probe Fed Rectangular Micro‐strip Patch Antenna

    標簽: Rectangular Microwave Antenna Design

    上傳時間: 2017-09-09

    上傳用戶:colinal

  • ARM-Linux-IIC設(shè)備的添加與驅(qū)動實現(xiàn)

        本文分析了ARM-Linux下IIC總線及其設(shè)備驅(qū)動的層次結(jié)構(gòu),指出了IIC設(shè)備添加與驅(qū)動實現(xiàn)的途徑,詳細闡述了如何采用通用i2c-dev.c驅(qū)動常規(guī)IIC設(shè)備、如何編寫特定IIC設(shè)備的Probe方式驅(qū)動、怎樣設(shè)計動態(tài)加載的簡易IIC“客服-驅(qū)動”、怎樣使用GPIO模擬IIC總線快速驅(qū)動設(shè)備等常用具體實現(xiàn)過程和關(guān)鍵環(huán)節(jié),并說明了這些方法的優(yōu)勢和不足。   

    標簽: ARM-Linux-IIC 設(shè)備 驅(qū)動實現(xiàn)

    上傳時間: 2013-10-13

    上傳用戶:xingisme

  • A Single-Chip Pulsoximeter Des

    This application report discusses the design of non-invasive optical plethysmographyalso called as pulsoximeter using the MSP430FG437 Microcontroller (MCU). Thepulsoximeter consists of a peripheral Probe combined with the MCU displaying theoxygen saturation and pulse rate on a LCD glass. The same sensor is used for bothheart-rate detection and pulsoximetering in this application. The Probe is placed on aperipheral point of the body such as a finger tip, ear lobe or the nose. The Probeincludes two light emitting diodes (LEDs), one in the visible red spectrum (660nm) andthe other in the infrared spectrum (940nm). The percentage of oxygen in the body isworked by measuring the intensity from each frequency of light after it transmitsthrough the body and then calculating the ratio between these two intensities.

    標簽: Pulsoximeter Single-Chip Des

    上傳時間: 2013-10-27

    上傳用戶:黑漆漆

  • 1

    1, SPI_877A,是針對Probe877A所寫。 SPI_877,是針對Probe877所寫。 SPI_77,是針對Probe77所寫。 初次使用使用PICMATE2004或者其簡化版精靈版,如果為以上提到的3款型號,并有TPDEM1, 請根據(jù)Probe型號在相應(yīng)文件夾下打開項目,編譯,并運行,具體連線請看各文件夾說明。 2, 其它文件夾項目均針對Probe877A所建立,如果要使用Probe877,請修改頭文件,并選擇Probe877支持的芯片。 3, 嚴格禁止將Probe877與877A混用,否則將造成仿真芯片工作異常。

    標簽:

    上傳時間: 2013-12-21

    上傳用戶:lz4v4

  • The VISA Probes for LabVIEW 7.0 greatly extend the amount of relevant information displayed when us

    The VISA Probes for LabVIEW 7.0 greatly extend the amount of relevant information displayed when using LabVIEW Probes on VISA refnums. They are used automatically by LabVIEW in place of the generic Probe when they are installed.

    標簽: information displayed relevant LabVIEW

    上傳時間: 2013-12-17

    上傳用戶:rocwangdp

  • This application report discusses the design of non-invasive optical plethysmography also called as

    This application report discusses the design of non-invasive optical plethysmography also called as pulsoximeter using the MSP430FG437 Microcontroller (MCU). The pulsoximeter consists of a peripheral Probe combined with the MCU displaying the oxygen saturation and pulse rate on a LCD glass. The same sensor is used for both heart-rate detection and pulsoximetering in this application. The Probe is placed on a peripheral point of the body such as a finger tip, ear lobe or the nose. The Probe includes two light emitting diodes (LEDs), one in the visible red spectrum (660nm) and the other in the infrared spectrum (940nm). The percentage of oxygen in the body is worked by measuring the intensity from each frequency of light after it transmits through the body and then calculating the ratio between these two intensities.

    標簽: plethysmography non-invasive application discusses

    上傳時間: 2014-01-17

    上傳用戶:天誠24

  • Agilent 34401A Service Guide.pdf

    Agilent 34401A Service Guide.pdfIEC Measurement Category II includes electrical devices connected to mains at an outlet on a branch circuit. Such devices include most small appliances, test equipment, and other devices that plug into a branch outlet or socket. The 34401A may be used to make measurements with the HI and LO inputs connected to mains in such devices, or to the branch outlet itself (up to 300 VAC). However, the 34401A may not be used with its HI and LO inputs connected to mains in permanently installed electrical devices such as the main circuit-breaker panel, sub-panel disconnect boxes, or permanently wired motors. Such devices and circuits are subject to overvoltages that may exceed the protection limits of the 34401A. Note: Voltages above 300 VAC may be measured only in circuits that are isolated from mains. However, transient overvoltages are also present on circuits that are isolated from mains. The Agilent 34401A are designed to safely withstand occasional transient overvoltages up to 2500 Vpk. Do not use this equipment to measure circuits where transient overvoltages could exceed this level. Additional Notices Waste Electrical and Electronic Equipment (WEEE) Directive 2002/96/EC This product complies with the WEEE Directive (2002/96/EC) marking requirement. The affixed product label (see below) indicates that you must not discard this electrical/electronic product in domestic household waste. Product Category: With reference to the equipment types in the WEEE directive Annex 1, this product is classified as a "Monitoring and Control instrumentation" product. Do not dispose in domestic household waste. To return unwanted products, contact your local Agilent office, or see www.agilent.com/environment/product for more information. Agilent 34138A Test Lead Set The Agilent 34401A is compatible with the Agilent 34138A Test Lead Set described below. Test Lead Ratings Test Leads - 1000V, 15A Fine Tip Probe Attachments - 300V, 3A Mini Grabber Attachment - 300V, 3A SMT Grabber Attachments - 300V, 3A Operation The Fine Tip, Mini Grabber, and SMT Grabber attachments plug onto the Probe end of the Test Leads. Maintenance If any portion of the Test Lead Set is worn or damaged, do not use. Replace with a new Agilent 3413

    標簽: agilent

    上傳時間: 2022-02-20

    上傳用戶:

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