universal ic Tester using 89c51 only one
標(biāo)簽： universal Tester 89c51 using
上傳時間： 2017-04-18
上傳用戶：佳期如夢
A class on for undirected graphs. Tester is available
標(biāo)簽： undirected available Tester graphs
上傳時間： 2013-12-12
上傳用戶：CHINA526
89c51 ic Tester 89c51 ic Tester
上傳時間： 2014-01-03
上傳用戶：talenthn
ic Tester 1 ic Tester 1 ic Tester 1
上傳時間： 2013-12-25
上傳用戶：稀世之寶039
J2EE Tester 測試器是一款用于測試發(fā)布于服務(wù)器端（如Weblogic, Websphere）的 EJB組件、Servlet以及 Beans的黑盒/白盒智能化測試工具。它的功能主要有以下三點： 1. 自動生成被測試類的覆蓋度測試報告，生成相應(yīng)的dmp文件。 2. 自動生成被測試類的出錯報告，記錄拋錯的行數(shù)，出錯類型,方法名稱，時間以及該行的代碼。 3. 按照需要在發(fā)生錯誤的行產(chǎn)生斷點，讓測試者查看此時各個變量的狀態(tài)。
標(biāo)簽： Websphere Weblogic Servlet Tester
上傳時間： 2017-06-01
上傳用戶：franktu
perl Tester to steam character sequence. formats it into lines
標(biāo)簽： character sequence formats Tester
上傳時間： 2017-08-18
上傳用戶：維子哥哥
READING CODE Tester
上傳時間： 2014-10-30
上傳用戶：佳期如夢
rs 232 Tester program
標(biāo)簽： program Tester 232 rs
上傳時間： 2013-12-17
上傳用戶：253189838
利用單片機(jī)具有的智能程序控制的特點，設(shè)計了基于STC89C52單片機(jī)的"二極管特性測試器"，可對二極管一般特性進(jìn)行快速測試。通過穩(wěn)定線性電流源給二極管加載恒定電流，然后由高精度模數(shù)轉(zhuǎn)換器測試其壓降，以此為基礎(chǔ)可判斷二極管好壞、檢測二極管極性和測試二極管伏安特性等，避免了用萬用表測試只能測得極性而不知其特性這一缺點。可用于電子設(shè)計制作過程中對二極管進(jìn)行快速測試，以確定被測二極管是否滿足電路的設(shè)計要求。 Abstract: By making good use of the intelligent control function of the Micro Controller Unit (MCU)， the diode trait Tester was designed based on the STC89C52，which could be used to test the trait of a diode rapidly. By loading constant current to diode through the stable linear current source， and measuring the voltage drop of the diode by high-precision analogue-to-digital converter (ADC)， it can judge whether the diode is good or not， distinguish the polarity of the diode， and test the trait that the diode， which can avoid the fault of using a multimeter can only measure the polarity but not the trait. This device can be used to test the trait of a diode quickly，and to make sure that whether a diode can be used in the electronic design or not.
上傳時間： 2013-11-13
上傳用戶：assef
Designing Boards with Atmel AT89C51,AT89C52, AT89C1051, and AT89C2051 for Writing Flash at In-Circuit Test. Recent improvements in chips and Testers have made it possible for the Tester to begin taking over the role tradi-tionally assigned to the PROM program-mer. Instead of having a PROM pro- grammer write nonvolatile memories before assembling the board, the in-cir- cuit Tester writes them during in-circuit testing operations. Many Teradyne Z18- series Testers are now in use loading code into nonvolatile memories, micro- controllers and in-circuit programmable logic devices. The purpose of this note is to explain how the Z18 approaches the writing task for Atmel AT89C series IC’s, so that designers of boards using these chips can get the best results.
上傳時間： 2013-11-17
上傳用戶：xiaozhiqban
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