there are some other approaches, such as Schedule Network Templates, dependency Determination, and Applying Leads and Lags. They are also use with PDM and ADM together for sequencing activities. Based on the different size or type of project, the managers should choose suitable approaches.
In this talk we will consider two approaches in dealing with the risk of supplier bankruptcy. In the first model, we study the effects of supply disruption risk in a supply chain where one buyer deals with competing risky suppliers who may default during their production lead-times.
The book then branches out into different approaches for incorporating Ajax, which include:
The Prototype and script.aculo.us Javascript libraries, the Dojo and Rico libraries, and DWR
Integrating Ajax into Java ServerPages (JSP) applications
Using Ajax with Struts
Integrating Ajax into Java ServerFaces (JSF) applications
Using Google s GWT, which offers a pure Java approach to developing web applications: your client-side components are written in Java, and compiled into HTML and JavaScript
本文論述了狀態(tài)機(jī)的verilog編碼風(fēng)格,以及不同編碼風(fēng)格的優(yōu)缺點(diǎn)，Steve Golson's 1994 paper, "State Machine Design Techniques for Verilog and VHDL" [1], is agreat paper on state machine design using Verilog, VHDL and Synopsys tools. Steve's paper alsooffers in-depth background concerning the origin of specific state machine types.This paper, "State Machine Coding Styles for Synthesis," details additional insights into statemachine design including coding style approaches and a few additional tricks.
Designing Boards with Atmel AT89C51,AT89C52, AT89C1051, and AT89C2051 for Writing Flash at In-Circuit Test.
Recent improvements in chips and testers have made it possible for the tester to begin taking over the role tradi-tionally assigned to the PROM program-mer. Instead of having a PROM pro- grammer write nonvolatile memories before assembling the board, the in-cir- cuit tester writes them during in-circuit testing operations. Many Teradyne Z18- series testers are now in use loading code into nonvolatile memories, micro- controllers and in-circuit programmable logic devices. The purpose of this note is to explain how the Z18 approaches the writing task for Atmel AT89C series IC’s, so that designers of boards using these chips can get the best results.
Designing Boards with Atmel AT89C51, AT89C52, AT89C1051, and AT89C2051 for Writing Flash at In-Circuit Test:Recent improvements in chips andtesters have made it possible for thetester to begin taking over the role traditionallyassigned to the PROM programmer.Instead of having a PROM programmerwrite nonvolatile memoriesbefore assembling the board, the in-circuittester writes them during in-circuittesting operations. Many Teradyne Z18-series testers are now in use loadingcode into nonvolatile memories, microcontrollersand in-circuit programmable logic devices. The purpose of this note is to explain how the Z18 approaches the writing task for Atmel AT89C series IC’s,so that designers of boards using these chips can get the best results.
The main objective of this book is to present all the relevant informationrequired for RF and micro-wave power amplifier design includingwell-known and novel theoretical approaches and practical design techniquesas well as to suggest optimum design approaches effectively combininganalytical calculations and computer-aided design. This bookcan also be very useful for lecturing to promote the analytical way ofthinking with practical verification by making a bridge between theoryand practice of RF and microwave engineering. As it often happens, anew result is the well-forgotten old one. Therefore, the demonstrationof not only new results based on new technologies or circuit schematicsis given, but some sufficiently old ideas or approaches are also introduced,that could be very useful in modern practice or could contributeto appearance of new ideas or schematic techniques.
Single-Ended and Differential S-Parameters
Differential circuits have been important incommunication systems for many years. In the past,differential communication circuits operated at lowfrequencies, where they could be designed andanalyzed using lumped-element models andtechniques. With the frequency of operationincreasing beyond 1GHz, and above 1Gbps fordigital communications, this lumped-elementapproach is no longer valid, because the physicalsize of the circuit approaches the size of awavelength.Distributed models and analysis techniques are nowused instead of lumped-element techniques.Scattering parameters, or S-parameters, have beendeveloped for this purpose [1]. These S-parametersare defined for single-ended networks. S-parameterscan be used to describe differential networks, but astrict definition was not developed until Bockelmanand others addressed this issue [2]. Bockelman’swork also included a study on how to adapt single-ended S-parameters for use with differential circuits[2]. This adaptation, called “mixed-mode S-parameters,” addresses differential and common-mode operation, as well as the conversion betweenthe two modes of operation.This application note will explain the use of single-ended and mixed-mode S-parameters, and the basicconcepts of microwave measurement calibration.
