MATLAB Example Code : For MATLAB developers, this example code will explaIN the usage of Ordinary Differential Equations ODE23 and ODE45 in the Matlab environment
Abstract: This application note describes how sampling clock jitter (time interval error or "TIE jitter") affectsthe performance of delta-sigma digital-to-analog converters (DACs). New insights explaIN the importanceof separately specifying low-frequency (< 2x passband frequency) and high-frequency or wideband (> 2xpassband frequency) jitter tolerance in these devices. The article also provides an application example ofa simple highly jittered cycle-skipped sampling clock and describes a method for generating a properbroadband jittered clock. The document then goes on to compare Maxim's audio DAC jitter tolerance tocompetitor audio DACs. Maxim's exceptionally high jitter tolerance allows very simple and low-cost sampleclock implementations.
A tutorial on SAR type A/D converters, this note contains detailed information on several 12-bit circuits. Comparator, clocking, and preamplifier designs are discussed. A final circuit gives a 12-bit conversion in 1.8µs. Appended sections explaIN the basic SAR technique and explore D/A considerations.
Designing Boards with Atmel AT89C51,AT89C52, AT89C1051, and AT89C2051 for Writing Flash at In-Circuit Test.
Recent improvements in chips and testers have made it possible for the tester to begin taking over the role tradi-tionally assigned to the PROM program-mer. Instead of having a PROM pro- grammer write nonvolatile memories before assembling the board, the in-cir- cuit tester writes them during in-circuit testing operations. Many Teradyne Z18- series testers are now in use loading code into nonvolatile memories, micro- controllers and in-circuit programmable logic devices. The purpose of this note is to explaIN how the Z18 approaches the writing task for Atmel AT89C series IC’s, so that designers of boards using these chips can get the best results.
主要介紹構(gòu)成記憶示波器的STC12C5408AD增強(qiáng)型單片機(jī)8通道10位模數(shù)轉(zhuǎn)換功能的設(shè)置、應(yīng)用和具體的匯編程序設(shè)計(jì)，以及PC機(jī)串行通訊和圖形顯示的高速匯編程序的設(shè)計(jì)要點(diǎn)，并列舉實(shí)例說(shuō)明其應(yīng)用效果。
Abstract:
The configuration, applications and the designs for? compiling program of the memorial oscillograph of 10 bits A/D conversation are introduced. It’s bases on STC12C5408AD 8? channels? single-chip? computer? in? enhancement? mode. It also recommends the devising essentials of high speed compiling program for PC serial communication and graphics display, lists examples to explaIN its effects in using.
Designing Boards with Atmel AT89C51, AT89C52, AT89C1051, and AT89C2051 for Writing Flash at In-Circuit Test:Recent improvements in chips andtesters have made it possible for thetester to begin taking over the role traditionallyassigned to the PROM programmer.Instead of having a PROM programmerwrite nonvolatile memoriesbefore assembling the board, the in-circuittester writes them during in-circuittesting operations. Many Teradyne Z18-series testers are now in use loadingcode into nonvolatile memories, microcontrollersand in-circuit programmable logic devices. The purpose of this note is to explaIN how the Z18 approaches the writing task for Atmel AT89C series IC’s,so that designers of boards using these chips can get the best results.
Internal Interrupts are used to respond to asynchronous requests from a certain part of themicrocontroller that needs to be serviced. Each peripheral in the TriCore as well as theBus Control Unit, the Debug Unit, the Peripheral Control Processor (PCP) and the CPUitself can generate an Interrupt Request.So what is an external Interrupt?An external Interrupt is something alike as the internal Interrupt. The difference is that anexternal Interrupt request is caused by an external event. Normally this would be a pulseon Port0 or Port1, but it can be even a signal from the input buffer of the SSC, indicatingthat a service is requested.The User’s Manual does not explaIN this aspect in detail so this ApNote will explaIN themost common form of an external Interrupt request. This ApNote will show that there is aneasy way to react on a pulse on Port0 or Port1 and to create with this impulse an InterruptService Request. Later in the second part of the document, you can find hints on how todebounce impulses to enable the use of a simple switch as the input device.Note: You will find additional information on how to setup the Interrupt System in theApNote “First steps through the TriCore Interrupt System” (AP3222xx)1. It would gobeyond the scope of this document to explaIN this here, but you will find selfexplanatoryexamples later on.
Single-Ended and Differential S-Parameters
Differential circuits have been important incommunication systems for many years. In the past,differential communication circuits operated at lowfrequencies, where they could be designed andanalyzed using lumped-element models andtechniques. With the frequency of operationincreasing beyond 1GHz, and above 1Gbps fordigital communications, this lumped-elementapproach is no longer valid, because the physicalsize of the circuit approaches the size of awavelength.Distributed models and analysis techniques are nowused instead of lumped-element techniques.Scattering parameters, or S-parameters, have beendeveloped for this purpose [1]. These S-parametersare defined for single-ended networks. S-parameterscan be used to describe differential networks, but astrict definition was not developed until Bockelmanand others addressed this issue [2]. Bockelman’swork also included a study on how to adapt single-ended S-parameters for use with differential circuits[2]. This adaptation, called “mixed-mode S-parameters,” addresses differential and common-mode operation, as well as the conversion betweenthe two modes of operation.This application note will explaIN the use of single-ended and mixed-mode S-parameters, and the basicconcepts of microwave measurement calibration.
explaIN how to open the Waveform Viewer for Verification
? State how to insert nodes into the Waveform Viewer
? Tell how to assign Stimulus with the Stimulator Selector
