The FM24C256/C256L/C256LZ devices are 256 Kbits CMOS
nonvolatile electrically erasable memory. These devices offer the
designer different low voltage and low power options. They
conform to all requirements in the Extended IIC 2-wire protocol.
Furthermore, they are designed to minimize device pin count and
simplify PC board layout requirements.
FEATURES
Unique 1-Wire interface requires only one port pin for communication
Multidrop capability simplifies distributed temperature sensing applications
Requires no external components
Can be powered from data line. Power supply range is 3.0V to 5.5V
Zero standby power required
Measures temperatures from -55°C to +125°C. Fahrenheit equivalent is -67°F to +257°F
±0.5°C accuracy from -10°C to +85°C
Thermometer resolution is programmable from 9 to 12 bits
Converts 12-bit temperature to digital word in 750 ms (max.)
User-definable, nonvolatile temperature alarm settings
Alarm search command identifies and addresses devices whose temperature is outside of programmed limits (temperature
alarm condition)
Applications include thermostatic controls, industrial systems, consumer products,
thermometers, or any thermally sensitive system
Designing Boards with Atmel AT89C51,AT89C52, AT89C1051, and AT89C2051 for Writing Flash at In-Circuit Test.
Recent improvements in chips and testers have made it possible for the tester to begin taking over the role tradi-tionally assigned to the PROM program-mer. Instead of having a PROM pro- grammer write nonvolatile memories before assembling the board, the in-cir- cuit tester writes them during in-circuit testing operations. Many Teradyne Z18- series testers are now in use loading code into nonvolatile memories, micro- controllers and in-circuit programmable logic devices. The purpose of this note is to explain how the Z18 approaches the writing task for Atmel AT89C series IC’s, so that designers of boards using these chips can get the best results.
Designing Boards with Atmel AT89C51, AT89C52, AT89C1051, and AT89C2051 for Writing Flash at In-Circuit Test:Recent improvements in chips andtesters have made it possible for thetester to begin taking over the role traditionallyassigned to the PROM programmer.Instead of having a PROM programmerwrite nonvolatile memoriesbefore assembling the board, the in-circuittester writes them during in-circuittesting operations. Many Teradyne Z18-series testers are now in use loadingcode into nonvolatile memories, microcontrollersand in-circuit programmable logic devices. The purpose of this note is to explain how the Z18 approaches the writing task for Atmel AT89C series IC’s,so that designers of boards using these chips can get the best results.
The AT89C52 is a low-power, high-performance CMOS 8-bit microcomputer with 8Kbytes of Flash programmable and erasable read only memory (PEROM). The deviceis manufactured using Atmel’s high-density nonvolatile memory technology and iscompatible with the industry-standard 80C51 and 80C52 instruction set and pinout.The on-chip Flash allows the program memory to be reprogrammed in-system or by aconventional nonvolatile memory programmer. By combining a versatile 8-bit CPUwith Flash on a monolithic chip, the Atmel AT89C52 is a powerful microcomputerwhich provides a highly-flexible and cost-effective solution to many embedded controlapplications.
This book introduces embedded systems to C and C++ programmers. Topics include testing memory devices, writing and erasing Flash memory, verifying nonvolatile memory contents, controlling on-chip peripherals, device driver design and implementation, optimizing embedded code for size and speed, and making the most of C++ without a performance penalty. Pages : 336 Slots : 1
This book introduces embedded systems to C and C++ programmers. Topics include testing memory devices, writing and erasing Flash memory, verifying nonvolatile memory contents, controlling on-chip peripherals, device driver design and implementation, optimizing embedded code for size and speed, and making the most of C++ without a performance penalty.
FLASH文件系統(tǒng)的源碼，F(xiàn)lash memory is a nonvolatile memory, which allows the user
to electrically program (write) and erase information. The
exponential growth of flash memory has made this technology
an indispensable part of hundreds of millions of electronic
devices.
Flash memory has several significant differences with volatile
(RAM) memory and hard drive technologies which requires
unique software drivers and file systems. This paper provides
an overview of file systems for flash memory and focuses on
the unique software requirements of flash memory devices.
Learn about the design tradeoffs involved in creating Windows CE .NET operating system (OS) solutions for hardware that implements one of many nonvolatile storage technologies. Different storage technologies, such as NAND and NOR flash memory, masked ROM, and electromechanical Advanced Technology Attachment (ATA) or Integrated Drive Electronics (IDE) storage, impose design constraints and create opportunities for the software environment. (30 printed pages)
This book introduces embedded systems to C and C++ programmers. Topics include testing memory devices, writing and erasing Flash memory, verifying nonvolatile memory contents, controlling on-chip peripherals, device driver design and implementation, optimizing embedded code for size and speed, and making the most of C++ without a performance penalty.
