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nonvolatile

  • The FM24C256/C256L/C256LZ devices are 256 Kbits CMOS nonvolatile electrically erasable memory. Thes

    The FM24C256/C256L/C256LZ devices are 256 Kbits CMOS nonvolatile electrically erasable memory. These devices offer the designer different low voltage and low power options. They conform to all requirements in the Extended IIC 2-wire protocol. Furthermore, they are designed to minimize device pin count and simplify PC board layout requirements.

    標(biāo)簽: 256 electrically nonvolatile erasable

    上傳時(shí)間: 2016-12-11

    上傳用戶:lps11188

  • DS18B20中文資料

    FEATURES  Unique 1-Wire interface requires only one port pin for communication  Multidrop capability simplifies distributed temperature sensing applications  Requires no external components  Can be powered from data line. Power supply range is 3.0V to 5.5V  Zero standby power required  Measures temperatures from -55°C to +125°C. Fahrenheit equivalent is -67°F to +257°F  ±0.5°C accuracy from -10°C to +85°C  Thermometer resolution is programmable from 9 to 12 bits  Converts 12-bit temperature to digital word in 750 ms (max.)  User-definable, nonvolatile temperature alarm settings  Alarm search command identifies and addresses devices whose temperature is outside of programmed limits (temperature alarm condition)  Applications include thermostatic controls, industrial systems, consumer products, thermometers, or any thermally sensitive system

    標(biāo)簽: 18B B20 DS 18

    上傳時(shí)間: 2013-08-04

    上傳用戶:CHENKAI

  • Atmel AT89C系列單片機(jī)電路板設(shè)計(jì)指南

    Designing Boards with Atmel AT89C51,AT89C52, AT89C1051, and AT89C2051 for Writing Flash at In-Circuit Test. Recent improvements in chips and testers have made it possible for the tester to begin taking over the role tradi-tionally assigned to the PROM program-mer. Instead of having a PROM pro- grammer write nonvolatile memories before assembling the board, the in-cir- cuit tester writes them during in-circuit testing operations. Many Teradyne Z18- series testers are now in use loading code into nonvolatile memories, micro- controllers and in-circuit programmable logic devices. The purpose of this note is to explain how the Z18 approaches the writing task for Atmel AT89C series IC’s, so that designers of boards using these chips can get the best results.  

    標(biāo)簽: Atmel 89C AT 89

    上傳時(shí)間: 2013-11-17

    上傳用戶:xiaozhiqban

  • Designing Boards with Atmel AT

    Designing Boards with Atmel AT89C51, AT89C52, AT89C1051, and AT89C2051 for Writing Flash at In-Circuit Test:Recent improvements in chips andtesters have made it possible for thetester to begin taking over the role traditionallyassigned to the PROM programmer.Instead of having a PROM programmerwrite nonvolatile memoriesbefore assembling the board, the in-circuittester writes them during in-circuittesting operations. Many Teradyne Z18-series testers are now in use loadingcode into nonvolatile memories, microcontrollersand in-circuit programmable logic devices. The purpose of this note is to explain how the Z18 approaches the writing task for Atmel AT89C series IC’s,so that designers of boards using these chips can get the best results.

    標(biāo)簽: Designing Boards Atmel with

    上傳時(shí)間: 2013-11-20

    上傳用戶:lijianyu172

  • at89c52 pdf

    The AT89C52 is a low-power, high-performance CMOS 8-bit microcomputer with 8Kbytes of Flash programmable and erasable read only memory (PEROM). The deviceis manufactured using Atmel’s high-density nonvolatile memory technology and iscompatible with the industry-standard 80C51 and 80C52 instruction set and pinout.The on-chip Flash allows the program memory to be reprogrammed in-system or by aconventional nonvolatile memory programmer. By combining a versatile 8-bit CPUwith Flash on a monolithic chip, the Atmel AT89C52 is a powerful microcomputerwhich provides a highly-flexible and cost-effective solution to many embedded controlapplications.

    標(biāo)簽: 89c c52 at

    上傳時(shí)間: 2013-11-10

    上傳用戶:1427796291

  • This book introduces embedded systems to C and C++ programmers. Topics include testing memory device

    This book introduces embedded systems to C and C++ programmers. Topics include testing memory devices, writing and erasing Flash memory, verifying nonvolatile memory contents, controlling on-chip peripherals, device driver design and implementation, optimizing embedded code for size and speed, and making the most of C++ without a performance penalty. Pages : 336 Slots : 1

    標(biāo)簽: programmers introduces embedded include

    上傳時(shí)間: 2013-12-10

    上傳用戶:shizhanincc

  • This book introduces embedded systems to C and C++ programmers. Topics include testing memory device

    This book introduces embedded systems to C and C++ programmers. Topics include testing memory devices, writing and erasing Flash memory, verifying nonvolatile memory contents, controlling on-chip peripherals, device driver design and implementation, optimizing embedded code for size and speed, and making the most of C++ without a performance penalty.

    標(biāo)簽: programmers introduces embedded include

    上傳時(shí)間: 2015-06-22

    上傳用戶:VRMMO

  • FLASH文件系統(tǒng)的源碼

    FLASH文件系統(tǒng)的源碼,F(xiàn)lash memory is a nonvolatile memory, which allows the user to electrically program (write) and erase information. The exponential growth of flash memory has made this technology an indispensable part of hundreds of millions of electronic devices. Flash memory has several significant differences with volatile (RAM) memory and hard drive technologies which requires unique software drivers and file systems. This paper provides an overview of file systems for flash memory and focuses on the unique software requirements of flash memory devices.

    標(biāo)簽: FLASH 文件系統(tǒng) 源碼

    上傳時(shí)間: 2015-11-29

    上傳用戶:問(wèn)題問(wèn)題

  • Learn about the design tradeoffs involved in creating Windows CE .NET operating system (OS) solution

    Learn about the design tradeoffs involved in creating Windows CE .NET operating system (OS) solutions for hardware that implements one of many nonvolatile storage technologies. Different storage technologies, such as NAND and NOR flash memory, masked ROM, and electromechanical Advanced Technology Attachment (ATA) or Integrated Drive Electronics (IDE) storage, impose design constraints and create opportunities for the software environment. (30 printed pages)

    標(biāo)簽: operating tradeoffs creating involved

    上傳時(shí)間: 2014-01-11

    上傳用戶:181992417

  • This book introduces embedded systems to C and C++ programmers. Topics include testing memory device

    This book introduces embedded systems to C and C++ programmers. Topics include testing memory devices, writing and erasing Flash memory, verifying nonvolatile memory contents, controlling on-chip peripherals, device driver design and implementation, optimizing embedded code for size and speed, and making the most of C++ without a performance penalty.

    標(biāo)簽: programmers introduces embedded include

    上傳時(shí)間: 2013-12-21

    上傳用戶:daoxiang126

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