Testability is the concern most often voiced by Texas Instruments (TIä )
application specific integrated circuit (ASIC) users. This document is intended
to consolidate TI policies into a coherent approach to designing for testability.
It is not intended as a specification, but as a guide you can use for developing
test strategies when designs are being initiated
Compact RIO Development Kit for Structural Health Monitoring
以National Instrument Compact RIO系統與NI-9211 for thermocouples, NI-9234 for accelerometers and NI-9237 for strain gages來開發嵌入式數據記錄(Data Logger)系統,以進行建筑物結構安全監測(Structural Health Monitoring,SHM).包含說明文件與LabVIEW的vi源代碼.
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