The design and manufacturing of wireless radio frequency (RF) transceivers has developed rapidly in recent ten
yeas due to rapid development of RF integrated circuits and the evolution of high-speed digital signal
processors (DSP). Such high speed signal processors, in conjunction with the development of high resolution
analog to digital converters and digital to analog converters, has made it possible for RF designers to digitize
higher intermediate frequencies, thus reducing the RF section and enhancing the overall performance of the RF
section.
Abstract: Many digital devices incorporate analog circuits. For instance, microprocessors, applicationspecificintegrated circuits (ASICs), and field-programmable gate arrays (FPGAs) may have internalvoltage references, analog-to-digital converters (ADCs) or digital-to-analog converters (DACs). However,there are challenges when you integrate more analog onto a digital design. As with all things in life, inelectronics we must always trade one parameter for another, with the application dictating the propertrade-off of analog function. In this application note, we examine how the demand for economy of spaceand cost pushes analog circuits onto digital substrates, and what design challenges emerge.
Abstract: The DS4830 optical microcontroller's analog-to-digital converter (ADC) offset can change with temperature and gainselection. However, the DS4830 allows users to measure the ADC internal offset. The measured ADC offset is added to the ADCoffset register to nullify the offset error. This application note demonstrates the DS4830's ADC internal offset calibration in theapplication program.
This unique guide to designing digital VLSI circuits takes a top-down approach, reflecting the natureof the design process in industry. Starting with architecture design, the book explains the why andhow of digital design, using the physics that designers need to know, and no more.Covering system and component aspects, design verification, VHDL modelling, clocking, signalintegrity, layout, electricaloverstress, field-programmable logic, economic issues, and more, thescope of the book is singularly comprehensive.
ANALOG INPUT BANDWIDTH is a measure of the frequencyat which the reconstructed output fundamental drops3 dB below its low frequency value for a full scale input. Thetest is performed with fIN equal to 100 kHz plus integer multiplesof fCLK. The input frequency at which the output is −3dB relative to the low frequency input signal is the full powerbandwidth.APERTURE JITTER is the variation in aperture delay fromsample to sample. Aperture jitter shows up as input noise.APERTURE DELAY See Sampling Delay.BOTTOM OFFSET is the difference between the input voltagethat just causes the output code to transition to the firstcode and the negative reference voltage. Bottom Offset isdefined as EOB = VZT–VRB, where VZT is the first code transitioninput voltage and VRB is the lower reference voltage.Note that this is different from the normal Zero Scale Error.CONVERSION LATENCY See PIPELINE DELAY.CONVERSION TIME is the time required for a completemeasurement by an analog-to-digital converter. Since theConversion Time does not include acquisition time, multiplexerset up time, or other elements of a complete conversioncycle, the conversion time may be less than theThroughput Time.DC COMMON-MODE ERROR is a specification which appliesto ADCs with differential inputs. It is the change in theoutput code that occurs when the analog voltages on the twoinputs are changed by an equal amount. It is usually expressed in LSBs.
特點(diǎn)(FEATURES) 精確度0.1%滿刻度 (Accuracy 0.1%F.S.) 可作各式數(shù)學(xué)演算式功能如:A+B/A-B/AxB/A/B/A&B(Hi or Lo)/|A| (Math functioA+B/A-B/AxB/A/B/A&B(Hi&Lo)/|A|/etc.....) 16 BIT 類比輸出功能(16 bit DAC isolating analog output function) 輸入/輸出1/輸出2絕緣耐壓2仟伏特/1分鐘(Dielectric strength 2KVac/1min. (input/output1/output2/power)) 寬范圍交直流兩用電源設(shè)計(jì)(Wide input range for auxiliary power) 尺寸小,穩(wěn)定性高(Dimension small and High stability)
為提高電容測(cè)量精度，針對(duì)電容式傳感器的工作原理設(shè)計(jì)了基于PIC16LF874單片機(jī)電容測(cè)量模塊。簡(jiǎn)單闡述了電容測(cè)量電路的應(yīng)用背景和國(guó)內(nèi)外研究現(xiàn)狀，介紹了美國(guó)Microchip公司PIC16LF874單片機(jī)的特性。電容式傳感器輸出的動(dòng)態(tài)微弱電容信號(hào)通過PS021型電容數(shù)字轉(zhuǎn)換器把模擬量數(shù)據(jù)轉(zhuǎn)換成數(shù)字量數(shù)據(jù)，所測(cè)數(shù)據(jù)由PIC16LF874單片機(jī)應(yīng)用程序進(jìn)行處理、顯示和保存。實(shí)驗(yàn)結(jié)果表明，固定電容標(biāo)稱值為10~20 pF 的測(cè)量值相對(duì)誤差在1%以內(nèi)，同時(shí)也可知被測(cè)電容容值越大，測(cè)量值和標(biāo)稱值相對(duì)誤差越小。
Abstract:
To improve the accuracy of capacitance measurement，aimed at the principle of work of mercury capacitance acceleration transducer，the design of micro capacitance measurement circuit is based on the key PIC16LF874 chip. Briefly discusses the application of the capacitance measuring circuit for the background and status of foreign researchers，focusing on the United States PIC16LF874 microcontroller features. Capacitive sensor outputed signal through the dynamics of weak PS021-chip capacitors （capacitancedigital converter） to convert analog data into digital data，the measured data from the PIC16LF874 microcontroller application process， display and preservation. Experimental results show that the fixed capacitor 10pF ~ 20pF nominal value of the measured value of relative error is within 1%，but also it canbe seen the value of the measured capacitance larger，measuring value and the nominal value of relative error smaller.
