a techniacl REPORT on 802.11n standard.
標簽： techniacl standard REPORT 802.11
上傳時間： 2013-12-17
上傳用戶：it男一枚
Self devrloped Demos for beginners of Matlab generate HTML REPORT and enjoy
標簽： devrloped beginners generate Matlab
上傳時間： 2017-08-20
上傳用戶：sy_jiadeyi
sap abap 資產(chǎn)負債表 *& Program type : REPORT * *& Description : OPPLE 資產(chǎn)負債表
標簽： Description Program REPORT OPPLE
上傳時間： 2017-08-24
上傳用戶：xinzhch
crystalREPORTviewer控件允許在應用程序中查看 Crystal REPORT。REPORTSource 屬性用于設(shè)置要查看哪個報表
標簽： crystalREPORTviewer REPORTSource Crystal REPORT
上傳時間： 2014-01-13
上傳用戶：ma1301115706
it is advanced c# 2008 REPORT application using REPORTviewer.
標簽： REPORTviewer application advanced REPORT
上傳時間： 2017-09-09
上傳用戶：llandlu
lab1 REPORT, with codelab1 REPORT, with code
上傳時間： 2013-12-10
上傳用戶：libenshu01
Haskell 1998 revised REPORT
標簽： Haskell revised REPORT 1998
上傳時間： 2013-12-28
上傳用戶：thinode
OPTOELECTRONICS CIRCUIT COLLECTION AVALANCHE PHOTODIODE BIAS SUPPLY 1Provides an output voltage of 0V to +80V for reverse biasingan avalanche photodiode to control its gain. This circuit canalso be reconfigured to supply a 0V to –80V output.LINEAR TEC DRIVER–1This is a bridge-tied load (BTL) linear amplifier for drivinga thermoelectric cooler (TEC). It operates on a single +5Vsupply and can drive ±2A into a common TEC.LINEAR TEC DRIVER–2This is very similar to DRIVER–1 but its power output stagewas modified to operate from a single +3.3V supply in orderto increase its efficiency. Driving this amplifier from astandard +2.5V referenced signal causes the output transistorsto have unequal power dissipation.LINEAR TEC DRIVER–3This BTL TEC driver power output stage achieves very highefficiency by swinging very close to its supply rails, ±2.5V.This driver can also drive ±2A into a common TEC. Operationis shown with the power output stage operating on±1.5V supplies. Under these conditions, this linear amplifiercan achieve very high efficiency. Application REPORTThe following collection of analog circuits may be useful in electro-optics applications such as optical networkingsystems. This page summarizes their salient characteristics.
標簽： 光電轉(zhuǎn)換 電路設(shè)計
上傳時間： 2013-10-27
上傳用戶：落花無痕
PCB LAYOUT 術(shù)語解釋(TERMS)1. COMPONENT SIDE(零件面、正面)︰大多數(shù)零件放置之面。2. SOLDER SIDE(焊錫面、反面)。3. SOLDER MASK(止焊膜面)︰通常指Solder Mask Open 之意。4. TOP PAD︰在零件面上所設(shè)計之零件腳PAD，不管是否鑽孔、電鍍。5. BOTTOM PAD：在銲錫面上所設(shè)計之零件腳PAD，不管是否鑽孔、電鍍。6. POSITIVE LAYER：單、雙層板之各層線路；多層板之上、下兩層線路及內(nèi)層走線皆屬之。7. NEGATIVE LAYER：通常指多層板之電源層。8. INNER PAD：多層板之POSITIVE LAYER 內(nèi)層PAD。9. ANTI-PAD：多層板之NEGATIVE LAYER 上所使用之絕緣範圍，不與零件腳相接。10. THERMAL PAD：多層板內(nèi)NEGATIVE LAYER 上必須零件腳時所使用之PAD，一般稱為散熱孔或?qū)住?1. PAD (銲墊)：除了SMD PAD 外，其他PAD 之TOP PAD、BOTTOM PAD 及INNER PAD 之形狀大小皆應相同。12. Moat : 不同信號的 Power& GND plane 之間的分隔線13. Grid : 佈線時的走線格點2. Test Point : ATE 測試點供工廠ICT 測試治具使用ICT 測試點 LAYOUT 注意事項:PCB 的每條TRACE 都要有一個作為測試用之TEST PAD(測試點)，其原則如下：1. 一般測試點大小均為30-35mil，元件分布較密時，測試點最小可至30mil.測試點與元件PAD 的距離最小為40mil。2. 測試點與測試點間的間距最小為50-75mil，一般使用75mil。密度高時可使用50mil,3. 測試點必須均勻分佈於PCB 上，避免測試時造成板面受力不均。4. 多層板必須透過貫穿孔(VIA)將測試點留於錫爐著錫面上(Solder Side)。5. 測試點必需放至於Bottom Layer6. 輸出test point REPORT(.asc 檔案powerpcb v3.5)供廠商分析可測率7. 測試點設(shè)置處:Setuppadsstacks
上傳時間： 2013-10-22
上傳用戶：pei5
LAYOUT REPORT .............. 1 目錄.................. 1 1. PCB LAYOUT 術(shù)語解釋(TERMS)......... 2 2. Test Point : ATE 測試點供工廠ICT 測試治具使用............ 2 3. 基準點 (光學點) -for SMD:........... 4 4. 標記 (LABEL ING)......... 5 5. VIA HOLE PAD................. 5 6. PCB Layer 排列方式...... 5 7.零件佈置注意事項 (PLACEMENT NOTES)............... 5 8. PCB LAYOUT 設(shè)計............ 6 9. Transmission Line ( 傳輸線 )..... 8 10.General Guidelines – 跨Plane.. 8 11. General Guidelines – 繞線....... 9 12. General Guidelines – Damping Resistor. 10 13. General Guidelines - RJ45 to Transformer................. 10 14. Clock Routing Guideline........... 12 15. OSC & CRYSTAL Guideline........... 12 16. CPU
上傳時間： 2013-12-20
上傳用戶：康郎
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