讀取STM32芯片內部唯一的標識，用于加密等區別其他芯片的操作，有完整注釋，測試通過-STM32 chip to read a unique identifier for the encryption and other differences other chip operation, with complete notes, test
上傳時間： 2013-05-24
上傳用戶：793212294
在軟件Proteus中仿真ucos（ARM）\r\n1.移植除了OS_CPU.h,OS_CPU_A.s,OS_CPU_C.C 三個函數外，對中斷專門用了一個函數OS_int_A.s 按其中的規則寫中斷函數即可. \r\n2。應用實例為\\ArmUCOS\\App\\test1\\test.mcp,在周立功2104的板子上的ram中就可直接運行(code＋data
上傳時間： 2013-09-30
上傳用戶：s363994250
微弱信號檢測裝置 四川理工學院 劉鵬飛、梁天德、曾學明 摘要： 本設計以TI的Launch Pad為核心板，采用鎖相放大技術設計并制作了一套微弱信號檢測裝置，用以檢測在強噪聲背景下已知頻率微弱正弦波信號的幅度值，并在液晶屏上數字顯示出所測信號相應的幅度值。實驗結果顯示其抗干擾能力強，測量精度高。 關鍵詞：強噪聲；微弱信號；鎖相放大；Launch Pad Abstract: This design is based on the Launch Pad of TI core board, using a lock-in amplifier technique designed and produced a weak signal detection device, to measure the known frequency sine wave signal amplitude values of the weak in the high noise background, and shows the measured signal amplitude of the corresponding value in the liquid crystal screen. Test results showed that it has high accuracy and strong anti-jamming capability. Keywords: weak signal detection; lock-in-amplifier; Launch Pad 1、引言 隨著現代科學技術的發展，在科研與生產過程中人們越來越需要從復雜高強度的噪聲中檢測出有用的微弱信號，因此對微弱信號的檢測成為當前科研的熱點。微弱信號并不意味著信號幅度小，而是指被噪聲淹沒的信號，“微弱”也僅是相對于噪聲而言的。只有在有效抑制噪聲的條件下有選擇的放大微弱信號的幅度，才能提取出有用信號。微弱信號檢測技術的應用相當廣泛，在生物醫學、光學、電學、材料科學等相關領域顯得愈發重要。 2、方案論證 針對微弱信號的檢測的方法有很多，比如濾波法、取樣積分器、鎖相放大器等。下面就針對這幾種方法做一簡要說明。 方案一：濾波法。 在大部分的檢測儀器中都要用到濾波方法對模擬信號進行一定的處理，例如隔離直流分量，改善信號波形，防止離散化時的波形混疊，克服噪聲的不利影響，提高信噪比等。常用的噪聲濾波器有：帶通、帶阻、高通、低通等。但是濾波方法檢測信號不能用于信號頻譜與噪聲頻譜重疊的情況，有其局限性。雖然可以對濾波器的通頻帶進行調節，但其噪聲抑制能力有限，同時其準確性與穩定性將大打折扣。
上傳時間： 2013-11-04
上傳用戶：lty6899826
Maxim Analog Essentials are a series of plug-in peripheral modules that allow engineers to quickly test, evaluate, and integrate Maxim components into their hardware/software designs. The modules electrically and physically conform to the Digilent Pmod™ interface specification and are compatible with any Digilent Pmod-compatible header.
標簽： 模擬技術
上傳時間： 2013-11-14
上傳用戶：ljj722
Precision 16-bit analog outputs with softwareconfigurableoutput ranges are often needed in industrialprocess control equipment, analytical and scientificinstruments and automatic test equipment. In the past,designing a universal output module was a daunting taskand the cost and PCB real estate associated with thisfunction were problematic, if not prohibitive.
上傳時間： 2014-12-23
上傳用戶：如果你也聽說
Digital-to-analog converters (DACs) are prevalent inindustrial control and automated test applications.General-purpose automated test equipment often requiresmany channels of precisely controlled voltagesthat span several voltage ranges. The LTC2704 is ahighly integrated 16-bit, 4-channel DAC for high-endapplications. It has a wide range of features designed toincrease performance and simplify design.
上傳時間： 2013-11-22
上傳用戶：元宵漢堡包
A complete design for a data acquisition card for the IBM PC is detailed in this application note. Additionally, C language code is provided to allow sampling of data at speed of more than 20kHz. The speed limitation is strictly based on the execution speed of the "C" data acquisition loop. A "Turbo" XT can acquire data at speeds greater than 20kHz. Machines with 80286 and 80386 processors can go faster than 20kHz. The computer that was used as a test bed in this application was an XT running at 4.77MHz and therefore all system timing and acquisition time measurements are based on a 4.77MHz clock speed.
上傳時間： 2013-10-29
上傳用戶：BOBOniu
Low power operation of electronic apparatus has becomeincreasingly desirable. Medical, remote data acquisition,power monitoring and other applications are good candidatesfor battery driven, low power operation. Micropoweranalog circuits for transducer-based signal conditioningpresent a special class of problems. Although micropowerICs are available, the interconnection of these devices toform a functioning micropower circuit requires care. (SeeBox Sections, “Some Guidelines for Micropower Designand an Example” and “Parasitic Effects of Test Equipmenton Micropower Circuits.”) In particular, trade-offs betweensignal levels and power dissipation become painful whenperformance in the 10-bit to 12-bit area is desirable.
上傳時間： 2013-10-22
上傳用戶：rocketrevenge
ANALOG INPUT BANDWIDTH is a measure of the frequencyat which the reconstructed output fundamental drops3 dB below its low frequency value for a full scale input. Thetest is performed with fIN equal to 100 kHz plus integer multiplesof fCLK. The input frequency at which the output is −3dB relative to the low frequency input signal is the full powerbandwidth.APERTURE JITTER is the variation in aperture delay fromsample to sample. Aperture jitter shows up as input noise.APERTURE DELAY See Sampling Delay.BOTTOM OFFSET is the difference between the input voltagethat just causes the output code to transition to the firstcode and the negative reference voltage. Bottom Offset isdefined as EOB = VZT–VRB, where VZT is the first code transitioninput voltage and VRB is the lower reference voltage.Note that this is different from the normal Zero Scale Error.CONVERSION LATENCY See PIPELINE DELAY.CONVERSION TIME is the time required for a completemeasurement by an analog-to-digital converter. Since theConversion Time does not include acquisition time, multiplexerset up time, or other elements of a complete conversioncycle, the conversion time may be less than theThroughput Time.DC COMMON-MODE ERROR is a specification which appliesto ADCs with differential inputs. It is the change in theoutput code that occurs when the analog voltages on the twoinputs are changed by an equal amount. It is usually expressed in LSBs.
上傳時間： 2013-11-12
上傳用戶：pans0ul
隨著科學技術的不斷發展，人們的生活水平的不斷提高，通信技術的不斷擴延，計算機已經涉及到各個不同的行業，成為人們生活、工作、學習、娛樂不可缺少的工具。而計算機主板作為計算機中非常重要的核心部件，其品質的好壞直接影響計算機整體品質的高低。因此在生產主板的過程中每一步都是要嚴格把關的，不能有絲毫的懈怠，這樣才能使其品質得到保證。 基于此，本文主要介紹電腦主板的SMT生產工藝流程和F/T(Function Test)功能測試步驟（F/T測試步驟以惠普H310機種為例）。讓大家了解一下完整的計算機主板是如何制成的，都要經過哪些工序以及如何檢測產品質量的。 本文首先簡單介紹了PCB板的發展歷史，分類，功能及發展趨勢，SMT及SMT產品制造系統，然后重點介紹了SMT生產工藝流程和F/T測試步驟。
上傳時間： 2013-11-06
上傳用戶：paladin
