As we enter the next millennium, there are clear technological patterns. First, the
electronic industry continues to scale microelectronic structures to achieve faster
devices, new devices, or more per unit area. Secondly, electrostatic charge, electrostatic
discharge (ESD), electrical overstress (EOS) and electromagnetic emissions (EMI)
continue to be a threat to these scaled structures. This dichotomy presents a dilemma
for the scaling of semiconductor technologies and a future threat to new technologies.
Technological advancements, material changes, design techniques, and simulation can
fend off this growing concern – but to maintain this ever-threatening challenge, one must
continue to establish research and education in this issue.
標簽：
ESD-Phenomena-and-the-Reliability
上傳時間：
2020-06-05
上傳用戶：shancjb
This edition of Digital Image Processing is a major revision of the book. As in
the 1977 and 1987 editions by Gonzalez and Wintz, and the 1992, 2002, and 2008
editions by Gonzalez and Woods, this sixth-generation edition was prepared
with students and instructors in mind. The principal objectives of the book
continue to be to provide an introduction to basic concepts and methodologies
applicable to digital image processing, and to develop a foundation that can
be used as the basis for further study and research in this field. To achieve
these objectives, we focused again on material that we believe is fundamental
and whose scope of application is not limited to the solution of specialized
problems. The mathematical complexity of the book remains at a level well
within the grasp of college seniors and first-year graduate students who have
introductory preparation in mathematical analysis, vectors, matrices, probability,
statistics, linear systems, and computer programming. The book website provides
tutorials to support readers needing a review of this background material
標簽：
Processing
Digital
Image
上傳時間：
2021-02-20
上傳用戶：
