RSA算法 :首先, 找出三個數, p, q, r, 其中 p, q 是兩個相異的質數, r 是與 (p-1)(q-1) 互質的數...... p, q, r 這三個數便是 person_key，接著, 找出 m, 使得 r^m == 1 mod (p-1)(q-1)..... 這個 m 一定存在, 因為 r 與 (p-1)(q-1) 互質, 用輾轉相除法就可以得到了..... 再來, 計算 n = pq....... m, n 這兩個數便是 public_key ，編碼過程是, 若資料為 a, 將其看成是一個大整數, 假設 a < n.... 如果 a >= n 的話, 就將 a 表成 s 進位 (s
The government of a small but important country has decided that the alphabet needs to be streamlined and reordered. Uppercase letters will be eliminated. They will issue a royal decree in the form of a String of B and A characters. The first character in the decree specifies whether a must come ( B )Before b in the new alphabet or ( A )After b . The second character determines the relative placement of b and c , etc. So, for example, "BAA" means that a must come Before b , b must come After c , and c must come After d .
Any letters beyond these requirements are to be excluded, so if the decree specifies k comparisons then the new alphabet will contain the first k+1 lowercase letters of the current alphabet.
Create a class Alphabet that contains the method choices that takes the decree as input and returns the number of possible new alphabets that conform to the decree. If more than 1,000,000,000 are possible, return -1.
Definition
This paper presents several low-latency mixed-timing
FIFO (first-in–first-out) interfaces designs that interface systems
on a chip working at different speeds. The connected systems
can be either synchronous or asynchronous. The designs are then
adapted to work between systems with very long interconnect
delays, by migrating a single-clock solution by Carloni et al.
(1999, 2000, and 2001) (for “latency-insensitive” protocols) to
mixed-timing domains. The new designs can be made arbitrarily
robust with regard to metastability and interface operating speeds.
Initial simulations for both latency and throughput are promising.
數字存儲器和混合信號超大規模集成電路
本書系統地介紹了數字、存儲器和混合信號VLSI系統的測試和可測試性設計。該書是根據作者多年的科研成果和教學實踐，結合國際上關注的最新研究熱點并參考大量的文獻撰寫的。全書共分三個部分。第一部分是測試基礎，介紹了測試基本概念、測試設備、測試經濟學和故障模型。第二部分是測試方法，詳細論述了組合和時序電路的測試生成、存儲器測試、基于DSP和基于模塊的模擬與混合信號測試、延遲測試和IDDQ測試等。第三部分是可測試性設計，包括掃描設計、BIST、邊界掃描測試、模擬測試總線標準和基于IP芯核的SOC（System on a chip）測試。
