This chapter surveys the high temperature and oxygen partial pressure
behavior of complex oxide heterostructures as determined by in situ synchrotron
X-ray methods. We consider both growth and post-growth behavior, emphasizing
the observation of structural and interfacial defects relevant to the size-dependent
properties seen in these systems.
標簽：
Metal-Oxides
Thin
Film
上傳時間：
2020-06-07
上傳用戶：shancjb
