Specifying the right reference and applying it correctly isa more difficult task than one might first surmise, consideringthat references are only 2- or 3-terminal devices.Although the word “accuracy” is most often spoken inreference to references, it is dangerous to use this wordtoo freely because it can mean different things to differentpeople. Even more perplexing is the fact that a referenceclassified as a dog in one application is a panacea inanother. This application note will familiarize the readerwith the various aspects of reference “accuracy” andpresent some tips on extracting maximum performancefrom any reference.
The voltage range of Linear Technology’s PowerPath® circuitscan be easily extended with just a few components, thusallowing them to meet the needs of virtually all applications.This application note presents solutions for circuits thatmust withstand large negative voltages, a reverse adapterinput for example, and circuits that must withstand largepositive inputs, such as automotive load-dump.
The LTM4601 DC/DC μModule regulator is a completehigh power density stepdown regulator for up to 12Acontinuous (14A peak) loads. The device is housed ina small 15mm ¥ 15mm ¥ 2.8mm LGA surface mountpackage, thus the large power dissipation is a challengein some applications. This thermal application note willprovide guidelines for using the μModule regulator inambient environments with or without air fl ow. Loadcurrent derating curves are provided for several inputvoltages and output voltages versus ambient temperatureand air fl ow.
In August of 1992 LTC published Application note 49,
“Illumination Circuitry for Liquid Crystal Displays.” One
notable aspect of this event is that it generated more
response than all previous LTC application notes combined.
This level of interest, along with significant performance
advances since AN-49’s appearance, justifies
further discussion of LCD backlighting circuitry.
Sensing and/or controlling current flow is a fundamental requirement in many electronics systems, and the tech-niques to do so are as diverse as the applications them-selves. This Application note compiles solutions to cur-rent sensing problems and organizes the solutions by general application type. These circuits have been culled from a variety of Linear Technology documents
Abstract: This application note describes how to build, debug, and run applications on the on-board MAXQ622microcontroller to interface with the DS8005 dual smart card interface. This is demonstrated in both IAREmbedded Workbench and the Rowley CrossWorks IDE, using sample code provided with the kit.
Designing read/write device (RWD) units for industrial RF-Identification
applications is strongly facilitated by the NXP Semiconductors HITAG
Reader Chip HTRC110. All needed function blocks, like the antenna
driver, modulator demodulator and antenna diagnosis unit, are integrated
in the HTRC110. Therefore only a minimum number of additional passive
components are required for a complete RWD.
This Application note describes how to design an industrial
RF-Identification system with the HTRC110. The major focus is
dimensioning of the antenna, all other external components including
clock and power supply, as well as the demodulation principle and its
implementatio
The MAX9257/MAX9258 programmable serializer/deserializer (SerDes) devices transfer both video data and control signals over the same twisted-pair cable. However, control data can only be transmitted during the vertical blank time, which is indicated by the control-channel-enabled output (CCEN) signal. The electronic control unit (ECU) firmware designer needs to know how quickly to respond to the CCEN signal before it times out and how to calculate this duration. This application note describes how to calculate the duration of the CCEN for the MAX9257/MAX9258 SerDes chipset. The calculation is based on STO timeout, clock frequency, and UART bit timing. The CCEN duration is programmable and can be closed if not in use.
Designing Boards with Atmel AT89C51,AT89C52, AT89C1051, and AT89C2051 for Writing Flash at In-Circuit Test.
Recent improvements in chips and testers have made it possible for the tester to begin taking over the role tradi-tionally assigned to the PROM program-mer. Instead of having a PROM pro- grammer write nonvolatile memories before assembling the board, the in-cir- cuit tester writes them during in-circuit testing operations. Many Teradyne Z18- series testers are now in use loading code into nonvolatile memories, micro- controllers and in-circuit programmable logic devices. The purpose of this note is to explain how the Z18 approaches the writing task for Atmel AT89C series IC’s, so that designers of boards using these chips can get the best results.
