Abstract: This application note describes how sampling clock jitter (time interval error or "TIE jitter") affectsthe PERFORMANCE of delta-sigma digital-to-analog converters (DACs). New insights explain the importanceof separately specifying low-frequency (< 2x passband frequency) and high-frequency or wideband (> 2xpassband frequency) jitter tolerance in these devices. The article also provides an application example ofa simple highly jittered cycle-skipped sampling clock and describes a method for generating a properbroadband jittered clock. The document then goes on to compare Maxim's audio DAC jitter tolerance tocompetitor audio DACs. Maxim's exceptionally high jitter tolerance allows very simple and low-cost sampleclock implementations.
Abstract: A digital RF modulator, an integrated solution that satisfies stringent DOCSIS RF-PERFORMANCErequirements, takes advantage of modern technologies like high-PERFORMANCE wideband digital-to-analogconversion and CMOS technology scaling. This application note describes the concept and advantages ofa digital quadrature amplitude modulation (QAM) modulator that uses the direct-RF architecture to enablea cable access platform (CCAP) system.
Abstract: Specifications such as noise, effective number of bits (ENOB), effective resolution, and noise-free resolution inlarge part define how accurate an ADC really is. Consequently, understanding the PERFORMANCE metrics related to noise isone of the most difficult aspects of transitioning from a SAR to a delta-sigma ADC. With the current demand for higherresolution, designers must develop a better understanding of ADC noise, ENOB, effective resolution, and signal-to-noiseratio (SNR). This application note helps that understanding.
Photodiodes can be broken into two categories: largearea photodiodes with their attendant high capacitance(30pF to 3000pF) and smaller area photodiodes withrelatively low capacitance (10pF or less). For optimalsignal-to-noise PERFORMANCE, a transimpedance amplifi erconsisting of an inverting op amp and a feedback resistoris most commonly used to convert the photodiode currentinto voltage. In low noise amplifi er design, large areaphotodiode amplifi ers require more attention to reducingop amp input voltage noise, while small area photodiodeamplifi ers require more attention to reducing op amp inputcurrent noise and parasitic capacitances.
Digital-to-analog converters (DACs) are prevalent inindustrial control and automated test applications.General-purpose automated test equipment often requiresmany channels of precisely controlled voltagesthat span several voltage ranges. The LTC2704 is ahighly integrated 16-bit, 4-channel DAC for high-endapplications. It has a wide range of features designed toincrease PERFORMANCE and simplify design.
Many 8-bit and 16-bit microcontrollers feature 10-bitinternal ADCs. A few include 12-bit ADCs, but these oftenhave poor or nonexistent AC specifi cations, and certainlylack the PERFORMANCE to meet the needs of an increasingnumber of applications. The LTC®2366 and its slowerspeed versions offer a high PERFORMANCE alternative, asshown in the AC specifi cations in Table 1. Compare theseguaranteed specifi cations with the ADC built into yourcurrent microcontroller.
Abstract: This application note explains how to layout the MAX20021/MAX20022 automotive quad powermanagementICs (PMICs) to maximize PERFORMANCE and minimize emissions. Example images of a fourlayerlayout are provided.
磁芯電感器的諧波失真分析 摘 要：簡述了改進(jìn)鐵氧體軟磁材料比損耗系數(shù)和磁滯常數(shù)ηB，從而降低總諧波失真THD的歷史過程，分析了諸多因數(shù)對諧波測量的影響，提出了磁心性能的調(diào)控方向。 關(guān)鍵詞：比損耗系數(shù)， 磁滯常數(shù)ηB ，直流偏置特性DC-Bias，總諧波失真THD Analysis on THD of the fer rite co res u se d i n i nductancShi Yan Nanjing Finemag Technology Co. Ltd., Nanjing 210033 Abstract: Histrory of decreasing THD by improving the ratio loss coefficient and hysteresis constant of soft magnetic ferrite is briefly narrated. The effect of many factors which affect the harmonic wave testing is analysed. The way of improving the PERFORMANCE of ferrite cores is put forward. Key words: ratio loss coefficient，hysteresis constant，DC-Bias，THD 近年來，變壓器生產(chǎn)廠家和軟磁鐵氧體生產(chǎn)廠家，在電感器和變壓器產(chǎn)品的總諧波失真指標(biāo)控制上，進(jìn)行了深入的探討和廣泛的合作，逐步弄清了一些似是而非的問題。從工藝技術(shù)上采取了不少有效措施，促進(jìn)了質(zhì)量問題的迅速解決。本文將就此熱門話題作一些粗淺探討。 一、 歷史回顧 總諧波失真（Total harmonic distortion） ，簡稱THD，并不是什么新的概念，早在幾十年前的載波通信技術(shù)中就已有嚴(yán)格要求<1>。1978年郵電部公布的標(biāo)準(zhǔn)YD/Z17－78“載波用鐵氧體罐形磁心”中，規(guī)定了高μQ材料制作的無中心柱配對罐形磁心詳細(xì)的測試電路和方法。如圖一電路所示，利用LC組成的150KHz低通濾波器在高電平輸入的情況下測量磁心產(chǎn)生的非線性失真。這種相對比較的實(shí)用方法，專用于無中心柱配對罐形磁心的諧波衰耗測試。 這種磁心主要用于載波電報(bào)、電話設(shè)備的遙測振蕩器和線路放大器系統(tǒng)，其非線性失真有很嚴(yán)格的要求。
圖中 ZD —— QF867 型阻容式載頻振蕩器，輸出阻抗 150Ω， Ld47 —— 47KHz 低通濾波器，阻抗 150Ω，阻帶衰耗大于61dB， Lg88 ——并聯(lián)高低通濾波器，阻抗 150Ω，三次諧波衰耗大于61dB Ld88 ——并聯(lián)高低通濾波器，阻抗 150Ω，三次諧波衰耗大于61dB FD —— 30～50KHz 放大器， 阻抗 150Ω， 增益不小于 43 dB，三次諧波衰耗b3(0)≥91 dB, DP —— Qp373 選頻電平表，輸入高阻抗， L ——被測無心罐形磁心及線圈， C ——聚苯乙烯薄膜電容器CMO-100V-707APF±0.5%,二只。
測量時(shí)，所配用線圈應(yīng)用絲包銅電磁線SQJ9×0.12(JB661-75)在直徑為16.1mm的線架上繞制 120 匝， （線架為一格） ， 其空心電感值為 318μH（誤差1％） 被測磁心配對安裝好后，先調(diào)節(jié)振蕩器頻率為 36.6～40KHz， 使輸出電平值為+17.4 dB， 即選頻表在 22′端子測得的主波電平 （P2）為+17.4 dB，然后在33′端子處測得輸出的三次諧波電平（P3）， 則三次諧波衰耗值為：b3(+2)= P2+S+ P3 式中：S 為放大器增益dB 從以往的資料引證， 就可以發(fā)現(xiàn)諧波失真的測量是一項(xiàng)很精細(xì)的工作，其中測量系統(tǒng)的高、低通濾波器，信號(hào)源和放大器本身的三次諧波衰耗控制很嚴(yán)，阻抗必須匹配，薄膜電容器的非線性也有相應(yīng)要求。濾波器的電感全由不帶任何磁介質(zhì)的大空心線圈繞成，以保證本身的“潔凈” ，不至于造成對磁心分選的誤判。 為了滿足多路通信整機(jī)的小型化和穩(wěn)定性要求， 必須生產(chǎn)低損耗高穩(wěn)定磁心。上世紀(jì) 70 年代初，1409 所和四機(jī)部、郵電部各廠，從工藝上改變了推板空氣窯燒結(jié)，出窯后經(jīng)真空罐冷卻的落后方式，改用真空爐，并控制燒結(jié)、冷卻氣氛。技術(shù)上采用共沉淀法攻關(guān)試制出了μQ乘積 60 萬和 100 萬的低損耗高穩(wěn)定材料，在此基礎(chǔ)上，還實(shí)現(xiàn)了高μ7000～10000材料的突破，從而大大縮短了與國外企業(yè)的技術(shù)差異。當(dāng)時(shí)正處于通信技術(shù)由FDM（頻率劃分調(diào)制）向PCM（脈沖編碼調(diào)制） 轉(zhuǎn)換時(shí)期， 日本人明石雅夫發(fā)表了μQ乘積125 萬為 0.8×10 ，100KHz）的超優(yōu)鐵氧體材料<3>，其磁滯系數(shù)降為優(yōu)鐵
Integrated EMI/Thermal Design forSwitching Power SuppliesWei ZhangThesis submitted to the Faculty of theVirginia Polytechnic Institute and State Universityin partial fulfillment of the requirements for the degree of
Integrated EMI/Thermal Design forSwitching Power SuppliesWei Zhang(ABSTRACT)This work presents the modeling and analysis of EMI and thermal PERFORMANCEfor switch power supply by using the CAD tools. The methodology and design guidelinesare developed.By using a boost PFC circuit as an example, an equivalent circuit model is builtfor EMI noise prediction and analysis. The parasitic elements of circuit layout andcomponents are extracted analytically or by using CAD tools. Based on the model, circuitlayout and magnetic component design are modified to minimize circuit EMI. EMI filtercan be designed at an early stage without prototype implementation.In the second part, thermal analyses are conducted for the circuit by using thesoftware Flotherm, which includes the mechanism of conduction, convection andradiation. Thermal models are built for the components. Thermal PERFORMANCE of thecircuit and the temperature profile of components are predicted. Improved thermalmanagement and winding arrangement are investigated to reduce temperature.In the third part, several circuit layouts and inductor design examples are checkedfrom both the EMI and thermal point of view. Insightful information is obtained.
