Abstract: The DS4830 optical microcontroller's analog-to-digital converter (ADC) offset can change with temperature and gainselection. However, the DS4830 allows users to measure the ADC internal offset. The measured ADC offset is added to the ADCoffset register to nullify the offset error. This application note demonstrates the DS4830's ADC internal offset calibration in theapplication program.
Abstract: IC switches and multiplexers are proliferating, thanks to near-continual progress in lowering the supply voltage,incorporating fault-protected inputs, clamping the output voltage, and reducing the switch resistances. The latest of these advancesis the inclusion of precision resistors to allow two-point calibration of gain and offset in precision data-acquisition systems.
The purpose of this application note is to show an example of how a digital potentiometer can be used in thefeedback loop of a step-up DC-DC converter to provide calibration and/or adjustment of the output voltage.The example circuit uses a MAX5025 step-up DC-DC converter (capable of generating up to 36V,120mWmax) in conjunction with a DS1845, 256 position, NV digital potentiometer. For this example, the desiredoutput voltage is 32V, which is generated from an input supply of 5V. The output voltage can be adjusted in35mV increments (near 32V) and span a range wide enough to account for resistance, potentiometer and DCDCconverter tolerances (27.6V to 36.7V).
The STM32F10xxx microcontroller family embeds up to three advanced 12-bit ADCs (depending on the device) with a conversion time down to 1 μs. A self-calibration feature is provided to enhance ADC accuracy versus environmental condition changes.
Abstract: A resistive feedback network is often used to set the output voltage of a power supply. A mechanical potentiometer (pot)conveniently solves the problem of adjusting a power supply. For easier automatic calibration, a mechanical pot can be replaced witha digital pot. This application note presents a calibration solution that uses a digital pot, because digipots are smaller, do not movewith age or vibration, and can be recalibrated remotely. This proposed solution reduces the susceptibility of the system to thetolerance of the digital pot's end-to-end resistance, making the solution optimal fordesigners. This application note also explainssome of the equations required to calculate the resistor chain values and to use a digital pot in this way. A spreadsheet withstandard reisistor values is available for easy calculations.
Abstract: This reference design provides design ideas for a cost-effective, low-power liquid-level measurement dataacquisition system (DAS) using a compensated silicon pressure sensor and a high-precision delta-sigma ADC. Thisdocument discusses how to select the compensated silicon pressure sensor, suggest system algorithms, and providenoise analyses. It also describes calibration ideas to improve system performance while also reducing complexity andcost.
Single-Ended and Differential S-Parameters
Differential circuits have been important incommunication systems for many years. In the past,differential communication circuits operated at lowfrequencies, where they could be designed andanalyzed using lumped-element models andtechniques. With the frequency of operationincreasing beyond 1GHz, and above 1Gbps fordigital communications, this lumped-elementapproach is no longer valid, because the physicalsize of the circuit approaches the size of awavelength.Distributed models and analysis techniques are nowused instead of lumped-element techniques.Scattering parameters, or S-parameters, have beendeveloped for this purpose [1]. These S-parametersare defined for single-ended networks. S-parameterscan be used to describe differential networks, but astrict definition was not developed until Bockelmanand others addressed this issue [2]. Bockelman’swork also included a study on how to adapt single-ended S-parameters for use with differential circuits[2]. This adaptation, called “mixed-mode S-parameters,” addresses differential and common-mode operation, as well as the conversion betweenthe two modes of operation.This application note will explain the use of single-ended and mixed-mode S-parameters, and the basicconcepts of microwave measurement calibration.
Abstract: This application note presents an overview of electronic margining and its value in detectingpotential system failures before a product ships from the factory. It is a calibration method that effectivelypredicts and allows adjustments to improve product quality. Margining also can be used to sort productsinto performance levels, allowing premium products to be sold at premium prices. We discuss thedownside of sorting and suggest alternative ways to segregate products.
來自澳大利亞Qeensland大學(xué)的計算機視覺Matlab工具箱。
This Toolbox provides a number of functions that are useful in computer vision,
machine vision and related areas. It is a somewhat eclectic collection reflecting
the author s personal interest in areas of photometry, photogrammetry, colorimetry. It
covers functions such as image file reading and writing, filtering, segmentation,
feature extraction, camera calibration, camera exterior orientation, display,
color space conversion and blackbody radiators. The Toolbox, combined
with MATLAB and a modern workstation computer, is a useful and convenient
environment for investigation of machine vision algorithms. It is possible to use
MEX files to interface with image acquisition hardware ranging from simple
framegrabbers to Datacube servers.
This paper introduces an affine invariant of trapezia, and the explicit constraint equation between the intrinsic matrix of a camera and the similarity invariants of a trapezium are established using the affine invariant. By this constraint, the inner parameters, motion parameters of the cameras and the similarity invariants of trapezia can be linearly determined using some prior knowledge on the cameras or the trapezia. The proposed algorithms have wide applicability since parallel lines are not rare in many scenes. Experimental results validate the proposed approaches. This work presents a unifying framework based on the parallelism constraint, and the previous methods based on the parallelograms or the parallelepipeds can be integrated into this framework.
Key words: invariant parallelism constraint camera calibration 3D reconstruction
