CAN波特率計算軟件 為了方便計算出 NXP 系列CAN 控制器(不包括NXP ARM 內嵌的CAN 控制器)的波特率
上傳時間： 2016-11-24
上傳用戶：test1111
超級兔子魔法設定 v5.88 繁體中文版 含序號
上傳時間： 2017-05-05
上傳用戶：kiili2
This effort started as an answer to the numerous questions the authors have repeatedly had to answer about electrostatic discharge (ESD) protection and input/output (1/0) designs. In the past no comprehensive book existed suffi- ciently covering these areas, and these topics were rarely taught in engineering schools. Thus first-time I/O and ESD protection designers have had consider- able trouble getting started. This book is in part an answer to such needs.
上傳時間： 2020-06-05
上傳用戶：shancjb
Contamination and electrostatic discharge (ESD) are now becoming recognized as factors affecting yield and reliability in an ever-increasing number of industries. Whereas contam- ination traditionally was recognized as affecting the semiconductor, disk drive, aerospace, pharmaceutical, and medical device industries, today such industries as automobile and food production are also discovering the benefits of contamination control. ESD control has experienced a similar growth in applications.
標簽： Contamination Control and ESD
上傳時間： 2020-06-05
上傳用戶：shancjb
Electrostatic discharge (ESD) phenomena have been known to mankind since the Greek Empire when Thales of Miletus, one of the Seven Sages of Greece, noticed the attraction of strands of hay to amber, leading to the coining of the word ‘‘electron.’’ In the 17th century, Gilbert and Cabeo addressed the attractive and repulsive nature of electricity. In the 18th century, a rapid increase of interest occurred for scientists in the understanding of electrical physics—Gray, du Fay, Nollet, Musschenbroeck, Franklin, Watson, Aepinus, Canton,
上傳時間： 2020-06-05
上傳用戶：shancjb
Failure analysis is invaluable in the learning process of electrostatic discharge (ESD) and electrical overstress (EOS) protection design and development [1–8]. In the failure analysis of EOS, ESD, and latchup events, there are a number of unique failure analysis processes andinformationthatcanprovidesignificantunderstandingandillumination[4].Today,thereis still no design methodology or computer-aided design (CAD) tool which will predict EOS, ESDprotectionlevels,andlatchupinasemiconductorchip;thisisoneofthesignificantreasons why failure analysis is critical to the ESD design discipline.
標簽： Mechanisms Failure Models ESD and
上傳時間： 2020-06-05
上傳用戶：shancjb
Electrostatic discharge (ESD) phenomena have been known to mankind since Thales of Miletus in approximately 600 B.C.E. noticed the attraction of strands of hay to amber. Two thousand six hundred years have passed and the quest to obtain a better under- standing of electrostatics and ESD phenomenon continues. Today, the manufacturing of microelectronics has continued the interest in the field of electrostatic phenomenon spanning factory issues, tooling, materials, and the microelectronic industry
上傳時間： 2020-06-05
上傳用戶：shancjb
The phenomenon of electrostatic discharge (ESD) has been known for a long time, but recently a growing interest has been observed in ESD in radio frequency (RF) technology and ESD issues in RF applications.
標簽： Technology Circuits ESD and RF
上傳時間： 2020-06-05
上傳用戶：shancjb
Electrostatic discharge (ESD) phenomena have been known to mankind since the Greek Empire when Thales of Miletus, one of the Seven Sages of Greece, noticed the attraction of strands of hay to amber, leading to the coining of the word “electron.” Electrical discharge and the guiding of electrical discharge (e.g., lightning) was of interest to Benjamin Franklin in the 1700s, with the invention of the lightning rod. The lightning rod was mankind’s first effort to guide the electrical discharge current of a lightning strike in a direction that would not harm structures.
標簽： Circuits Devices 2015 ESD and
上傳時間： 2020-06-05
上傳用戶：shancjb
Dear Reader, this book project brings to you a unique study tool for ESD protection solutions used in analog-integrated circuit (IC) design. Quick-start learning is combined with in-depth understanding for the whole spectrum of cross- disciplinary knowledge required to excel in the ESD field. The chapters cover technical material from elementary semiconductor structure and device levels up to complex analog circuit design examples and case studies.
標簽： Circuits Design Analog ESD for
上傳時間： 2020-06-05
上傳用戶：shancjb
