This application report discusses the design of non-invasive optical plethysmographyalso called as pulsoximeter using the MSP430FG437 Microcontroller (MCU). Thepulsoximeter consists of a peripheral probe combined with the MCU displaying theoxygen saturation and pulse rate on a LCD glass. The same sensor is used for bothheart-rate detection and pulsoximetering in this application. The probe is placed on aperipheral point of the body such as a finger tip, ear lobe or the nose. The probeincludes two light emitting diodes (LEDs), one in the visible red spectrum (660nm) andthe other in the infrared spectrum (940nm). The percentage of oxygen in the body isworked by measuring the intensity from each frequency of light after it transmitsThrough the body and then calculating the ratio between these two intensities.
標簽： Pulsoximeter Single-Chip Des
上傳時間： 2013-10-27
上傳用戶：黑漆漆
Luminary Micro Stellaris™ microcontrollers that are equipped with an analog-to-digital converter(ADC), use an innovative sequence-based sampling architecture designed to be extremely flexible,yet easy to use. This application note describes the sampling architecture of the ADC. Sinceprogrammers can configure Stellaris microcontrollers either Through the powerful StellarisFamilyDriver Library or Through direct writes to the device's control registers, this application note describesboth methods. The information presented in this document is intended to complement the ADCchapter of the device datasheet, and assumes the reader has a basic understanding of howADCsfunction.
標簽： Microcontr Stellaris Using the
上傳時間： 2013-10-14
上傳用戶：blans
單片機指令系統 3.1 MCS－51指令簡介 3.2 指令系統 3.1 MCS－51指令簡介 二、MCS－51系列單片機指令系統分類 按尋址方式分為以下七種：按功能分為以下四種： 1、立即立即尋址 1、數據傳送指令位操 2、直接尋址 2、算術運算指令 3、寄存器尋址 3、邏輯運算指令 4、寄存器間接尋址指令 4、控制轉移類指令 5、相對尋址 5、位操作指令 6、變址尋址 7、位尋址 三、尋址方式 3、寄存器間接尋址 MOV A, @R1 操作數是通過寄存器間接得到的。 4、立即尋址 MOV A, #40H 操作數在指令中直接給出。 5、基址寄存器加變址寄存器尋址 以DPTR或PC為基址寄存器，以A為變址寄存器， 以兩者相加形成的16位地址為操作數的地址。 MOVC A, @A+DPTR MOVC A, @A+PC 四、指令中常用符號說明 Rn——當前寄存器區的8個工作寄存器R0～R7(n＝0～7)； Ri——當前寄存器區可作地址寄存器的2個工作寄存器R0和R1(i＝0，1)； direct——8位內部數據存儲器單元的地址及特殊功能寄存器的地址； #data——表示8位常數（立即數）； #datal6——表示16位常數； add 16——表示16位地址； addrll——表示11位地址； rel——8位帶符號的地址偏移量； bit——表示位地址； @——間接尋址寄存器或基址寄存器的前綴； ( )——表示括號中單元的內容 (( ))——表示間接尋址的內容； 五、MCS－51指令簡介 1. 以累加器A為目的操作數的指令 2. 以Rn為目的操作數的指令 3. 以直接地址為目的操作數的指令 4. 以寄存器間接地址為目的操作數指令 應用舉例1 8段數碼管顯示 應用舉例2 3.2 指令系統 2、堆棧操作指令 3. 累加器A與外部數據傳輸指令 4. 查表指令 MOVC A, @A+PC 例子： 5. 字節交換指令 6. 半字節交換指令 二、算術操作類指令 PSW寄存器 2. 帶進位加法指令 3. 加1指令 4. 十進制調整指令 5. 帶借位減法指令（Subtraction） 6. 減1指令（Decrease） 7. 乘法指令（Multiplication） 8. 除法指令（Division） 三、邏輯運算指令 1. 簡單邏輯操作指令 2. 循環指令 帶進位左循環指令（Rotate Accumulator Left Through Carry flag） 右循環指令（Rotate Accumulator Right） 帶進位右循環指令（Rotate A Right with C） 3. 邏輯與指令 4. 邏輯或指令 5. 邏輯異或指令 四、控制轉移類指令 1. 跳轉指令 相對轉移指令 SJMP rel PC←(PC)+2 PC←(PC)+rel 程序中標號與地址之間的關系 2. 條件轉移指令 3. 比較不相等轉移指令 4. 減 1 不為 0 轉移指令 5. 調用子程序指令 7. 中斷返回指令 五、位操作指令 1. 數據位傳送指令 2. 位變量邏輯指令 3. 條件轉移類指令
上傳時間： 2013-10-27
上傳用戶：xuanjie
The μPSD32xx family, from ST, consists of Flash programmable system devices with a 8032 MicrocontrollerCore. Of these, the μPSD3234A and μPSD3254A are notable for having a complete implementationof the USB hardware directly on the chip, complying with the Universal Serial Bus Specification, Revision1.1.This application note describes a demonstration program that has been written for the DK3200 hardwaredemonstration kit (incorporating a μPSD3234A device). It gives the user an idea of how simple it is to workwith the device, using the HID class as a ready-made device driver for the USB connection.IN-APPLICATION-PROGRAMMING (IAP) AND IN-SYSTEM-PROGRAMMING (ISP)Since the μPSD contains two independent Flash memory arrays, the Micro Controller Unit (MCU) can executecode from one memory while erasing and programming the other. Product firmware updates in thefield can be reliably performed over any communication channel (such as CAN, Ethernet, UART, J1850)using this unique architecture. For In-Application-Programming (IAP), all code is updated Through theMCU. The main advantage for the user is that the firmware can be updated remotely. The target applicationruns and takes care on its own program code and data memory.IAP is not the only method to program the firmware in μPSD devices. They can also be programmed usingIn-System-Programming (ISP). A IEEE1149.1-compliant JTAG interface is included on the μPSD. Withthis, the entire device can be rapidly programmed while soldered to the circuit board (Main Flash memory,Secondary Boot Flash memory, the PLD, and all configuration areas). This requires no MCU participation.The MCU is completely bypassed. So, the μPSD can be programmed or reprogrammed any time, anywhere, even when completely uncommitted.Both methods take place with the device in its normal hardware environment, soldered to a printed circuitboard. The IAP method cannot be used without previous use of ISP, because IAP utilizes a small amountof resident code to receive the service commands, and to perform the desired operations.
標簽： Demonstration 3200 USB for
上傳時間： 2014-02-27
上傳用戶：zhangzhenyu
Internal Interrupts are used to respond to asynchronous requests from a certain part of themicrocontroller that needs to be serviced. Each peripheral in the TriCore as well as theBus Control Unit, the Debug Unit, the Peripheral Control Processor (PCP) and the CPUitself can generate an Interrupt Request.So what is an external Interrupt?An external Interrupt is something alike as the internal Interrupt. The difference is that anexternal Interrupt request is caused by an external event. Normally this would be a pulseon Port0 or Port1, but it can be even a signal from the input buffer of the SSC, indicatingthat a service is requested.The User’s Manual does not explain this aspect in detail so this ApNote will explain themost common form of an external Interrupt request. This ApNote will show that there is aneasy way to react on a pulse on Port0 or Port1 and to create with this impulse an InterruptService Request. Later in the second part of the document, you can find hints on how todebounce impulses to enable the use of a simple switch as the input device.Note: You will find additional information on how to setup the Interrupt System in theApNote “First steps Through the TriCore Interrupt System” (AP3222xx)1. It would gobeyond the scope of this document to explain this here, but you will find selfexplanatoryexamples later on.
上傳時間： 2013-10-27
上傳用戶：zhangyigenius
All inputs of the C16x family have Schmitt-Trigger input characteristics. These Schmitt-Triggers are intended to always provide proper internal low and high levels, even if anundefined voltage level (between TTL-VIL and TTL-VIH) is externally applied to the pin.The hysteresis of these inputs, however, is very small, and can not be properly used in anapplication to suppress signal noise, and to shape slow rising/falling input transitions.Thus, it must be taken care that rising/falling input signals pass the undefined area of theTTL-specification between VIL and VIH with a sufficient rise/fall time, as generally usualand specified for TTL components (e.g. 74LS series: gates 1V/us, clock inputs 20V/us).The effect of the implemented Schmitt-Trigger is that even if the input signal remains inthe undefined area, well defined low/high levels are generated internally. Note that allinput signals are evaluated at specific sample points (depending on the input and theperipheral function connected to it), at that signal transitions are detected if twoconsecutive samples show different levels. Thus, only the current level of an input signalat these sample points is relevant, that means, the necessary rise/fall times of the inputsignal is only dependant on the sample rate, that is the distance in time between twoconsecutive evaluation time points. If an input signal, for instance, is sampled Throughsoftware every 10us, it is irrelevant, which input level would be seen between thesamples. Thus, it would be allowable for the signal to take 10us to pass Through theundefined area. Due to the sample rate of 10us, it is assured that only one sample canoccur while the signal is within the undefined area, and no incorrect transition will bedetected. For inputs which are connected to a peripheral function, e.g. capture inputs, thesample rate is determined by the clock cycle of the peripheral unit. In the case of theCAPCOM unit this means a sample rate of 400ns @ 20MHz CPU clock. This requiresinput signals to pass Through the undefined area within these 400ns in order to avoidmultiple capture events.For input signals, which do not provide the required rise/fall times, external circuitry mustbe used to shape the signal transitions.In the attached diagram, the effect of the sample rate is shown. The numbers 1 to 5 in thediagram represent possible sample points. Waveform a) shows the result if the inputsignal transition time Through the undefined TTL-level area is less than the time distancebetween the sample points (sampling at 1, 2, 3, and 4). Waveform b) can be the result ifthe sampling is performed more than once within the undefined area (sampling at 1, 2, 5,3, and 4).Sample points:1. Evaluation of the signal clearly results in a low level2. Either a low or a high level can be sampled here. If low is sampled, no transition willbe detected. If the sample results in a high level, a transition is detected, and anappropriate action (e.g. capture) might take place.3. Evaluation here clearly results in a high level. If the previous sample 2) had alreadydetected a high, there is no change. If the previous sample 2) showed a low, atransition from low to high is detected now.
上傳時間： 2013-10-23
上傳用戶：copu
All inputs of the C16x family have Schmitt-Trigger input characteristics. These Schmitt-Triggers are intended to always provide proper internal low and high levels, even if anundefined voltage level (between TTL-VIL and TTL-VIH) is externally applied to the pin.The hysteresis of these inputs, however, is very small, and can not be properly used in anapplication to suppress signal noise, and to shape slow rising/falling input transitions.Thus, it must be taken care that rising/falling input signals pass the undefined area of theTTL-specification between VIL and VIH with a sufficient rise/fall time, as generally usualand specified for TTL components (e.g. 74LS series: gates 1V/us, clock inputs 20V/us).The effect of the implemented Schmitt-Trigger is that even if the input signal remains inthe undefined area, well defined low/high levels are generated internally. Note that allinput signals are evaluated at specific sample points (depending on the input and theperipheral function connected to it), at that signal transitions are detected if twoconsecutive samples show different levels. Thus, only the current level of an input signalat these sample points is relevant, that means, the necessary rise/fall times of the inputsignal is only dependant on the sample rate, that is the distance in time between twoconsecutive evaluation time points. If an input signal, for instance, is sampled Throughsoftware every 10us, it is irrelevant, which input level would be seen between thesamples. Thus, it would be allowable for the signal to take 10us to pass Through theundefined area. Due to the sample rate of 10us, it is assured that only one sample canoccur while the signal is within the undefined area, and no incorrect transition will bedetected. For inputs which are connected to a peripheral function, e.g. capture inputs, thesample rate is determined by the clock cycle of the peripheral unit. In the case of theCAPCOM unit this means a sample rate of 400ns @ 20MHz CPU clock. This requiresinput signals to pass Through the undefined area within these 400ns in order to avoidmultiple capture events.
上傳時間： 2014-04-02
上傳用戶：han_zh
P C B 可測性設計布線規則之建議― ― 從源頭改善可測率PCB 設計除需考慮功能性與安全性等要求外，亦需考慮可生產與可測試。這里提供可測性設計建議供設計布線工程師參考。1. 每一個銅箔電路支點，至少需要一個可測試點。如無對應的測試點，將可導致與之相關的開短路不可檢出，并且與之相連的零件會因無測試點而不可測。2. 雙面治具會增加制作成本，且上針板的測試針定位準確度差。所以Layout 時應通過Via Hole 盡可能將測試點放置于同一面。這樣就只要做單面治具即可。3. 測試選點優先級：A.測墊(Test Pad) B.通孔(Through Hole) C.零件腳(Component Lead) D.貫穿孔(Via Hole)(未Mask)。而對于零件腳，應以AI 零件腳及其它較細較短腳為優先，較粗或較長的引腳接觸性誤判多。4. PCB 厚度至少要62mil(1.35mm)，厚度少于此值之PCB 容易板彎變形，影響測點精準度，制作治具需特殊處理。5. 避免將測點置于SMT 之PAD 上，因SMT 零件會偏移，故不可靠，且易傷及零件。6. 避免使用過長零件腳(>170mil(4.3mm))或過大的孔(直徑>1.5mm)為測點。7. 對于電池(Battery)最好預留Jumper，在ICT 測試時能有效隔離電池的影響。8. 定位孔要求：(a) 定位孔(Tooling Hole)直徑最好為125mil(3.175mm)及其以上。(b) 每一片PCB 須有2 個定位孔和一個防呆孔(也可說成定位孔,用以預防將PCB反放而導致機器壓破板)，且孔內不能沾錫。(c) 選擇以對角線，距離最遠之2 孔為定位孔。(d) 各定位孔(含防呆孔)不應設計成中心對稱,即PCB 旋轉180 度角后仍能放入PCB,這樣,作業員易于反放而致機器壓破板)9. 測試點要求：(e) 兩測點或測點與預鉆孔之中心距不得小于50mil(1.27mm)，否則有一測點無法植針。以大于100mil(2.54mm)為佳，其次是75mil(1.905mm)。(f) 測點應離其附近零件(位于同一面者)至少100mil，如為高于3mm 零件，則應至少間距120mil，方便治具制作。(g) 測點應平均分布于PCB 表面，避免局部密度過高，影響治具測試時測試針壓力平衡。(h) 測點直徑最好能不小于35mil(0.9mm)，如在上針板，則最好不小于40mil(1.00mm)，圓形、正方形均可。小于0.030”(30mil)之測點需額外加工，以導正目標。(i) 測點的Pad 及Via 不應有防焊漆(Solder Mask)。(j) 測點應離板邊或折邊至少100mil。(k) 錫點被實踐證實是最好的測試探針接觸點。因為錫的氧化物較輕且容易刺穿。以錫點作測試點，因接觸不良導致誤判的機會極少且可延長探針使用壽命。錫點尤其以PCB 光板制作時的噴錫點最佳。PCB 裸銅測點，高溫后已氧化，且其硬度高，所以探針接觸電阻變化而致測試誤判率很高。如果裸銅測點在SMT 時加上錫膏再經回流焊固化為錫點，雖可大幅改善，但因助焊劑或吃錫不完全的緣故，仍會出現較多的接觸誤判。
上傳時間： 2014-01-14
上傳用戶：cylnpy
設計一種應用于某全地形ATV車載武器裝置中的中控系統，該系統設計是以TMS320F2812型DSP為核心，采用模塊化設計思想，對其硬件部分進行系統設計，能夠完成對武器裝置高低、回轉方向的運動控制，實現靜止或行進狀態中對目標物的測距，自動瞄準以及按既定發射模式發射彈丸和各項安全性能檢測等功能。通過編制相應的軟件，對其進行系統調試，驗證了該設計運行穩定。 Abstract: A central control system applied to an ATV vehicle weapons is designed. The system design is based on TMS320F2812 DSP as the core， uses modular design for its hardware parts. The central control system can complete the motion control of the level of weapons and equipment， rotation direction， to achieve a state of static or moving objects on the target ranging， auto-targeting and according to the established target and the projectile and the launch of the security performance testing and other functions. Through the development of appropriate software and to carry out system testing to verify the stability of this design and operation.
上傳時間： 2013-11-02
上傳用戶：jshailingzzh
中文版詳情瀏覽：http://www.elecfans.com/emb/fpga/20130715324029.html Xilinx UltraScale:The Next-Generation Architecture for Your Next-Generation Architecture The Xilinx® UltraScale™ architecture delivers unprecedented levels of integration and capability with ASIC-class system- level performance for the most demanding applications. The UltraScale architecture is the industr y's f irst application of leading-edge ASIC architectural enhancements in an All Programmable architecture that scales from 20 nm planar Through 16 nm FinFET technologies and beyond, in addition to scaling from monolithic Through 3D ICs. Through analytical co-optimization with the X ilinx V ivado® Design Suite, the UltraScale architecture provides massive routing capacity while intelligently resolving typical bottlenecks in ways never before possible. This design synergy achieves greater than 90% utilization with no performance degradation. Some of the UltraScale architecture breakThroughs include: • Strategic placement (virtually anywhere on the die) of ASIC-like system clocks, reducing clock skew by up to 50% • Latency-producing pipelining is virtually unnecessary in systems with massively parallel bus architecture, increasing system speed and capability • Potential timing-closure problems and interconnect bottlenecks are eliminated, even in systems requiring 90% or more resource utilization • 3D IC integration makes it possible to build larger devices one process generation ahead of the current industr y standard • Greatly increased system performance, including multi-gigabit serial transceivers, I/O, and memor y bandwidth is available within even smaller system power budgets • Greatly enhanced DSP and packet handling The Xilinx UltraScale architecture opens up whole new dimensions for designers of ultra-high-capacity solutions.
標簽： UltraScale Xilinx 架構
上傳時間： 2013-11-13
上傳用戶：瓦力瓦力hong
