微弱信號檢測裝置
四川理工學院 劉鵬飛、梁天德、曾學明
摘要：
本設計以TI的Launch Pad為核心板，采用鎖相放大技術設計并制作了一套微弱信號檢測裝置，用以檢測在強噪聲背景下已知頻率微弱正弦波信號的幅度值，并在液晶屏上數字顯示出所測信號相應的幅度值。實驗結果顯示其抗干擾能力強，測量精度高。
關鍵詞：強噪聲；微弱信號；鎖相放大；Launch Pad
Abstract:
This design is based on the Launch Pad of TI core board, using a lock-in amplifier technique designed and produced a weak signal detection device, to measure the known frequency sine wave signal amplitude values of the weak in the high noise background, and shows the measured signal amplitude of the corresponding value in the liquid crystal screen. Test results showed that it has high accuracy and strong anti-jamming capability.
Keywords: weak signal detection; lock-in-amplifier; Launch Pad
1、引言
隨著現代科學技術的發展，在科研與生產過程中人們越來越需要從復雜高強度的噪聲中檢測出有用的微弱信號，因此對微弱信號的檢測成為當前科研的熱點。微弱信號并不意味著信號幅度小，而是指被噪聲淹沒的信號，“微弱”也僅是相對于噪聲而言的。只有在有效抑制噪聲的條件下有選擇的放大微弱信號的幅度，才能提取出有用信號。微弱信號檢測技術的應用相當廣泛，在生物醫學、光學、電學、材料科學等相關領域顯得愈發重要。
2、方案論證
針對微弱信號的檢測的方法有很多，比如濾波法、取樣積分器、鎖相放大器等。下面就針對這幾種方法做一簡要說明。
方案一：濾波法。
在大部分的檢測儀器中都要用到濾波方法對模擬信號進行一定的處理，例如隔離直流分量，改善信號波形，防止離散化時的波形混疊，克服噪聲的不利影響，提高信噪比等。常用的噪聲濾波器有：帶通、帶阻、高通、低通等。但是濾波方法檢測信號不能用于信號頻譜與噪聲頻譜重疊的情況，有其局限性。雖然可以對濾波器的通頻帶進行調節，但其噪聲抑制能力有限，同時其準確性與穩定性將大打折扣。
為了提高數字水印抗擊各種圖像攻擊的性能和保持圖像的穩健性和不可見性，提出了一種基于離散小波變換（DWT），SVD（singular value decomposition）奇異值分解水印圖像和原始載體圖像的離散余弦變換（DCT）的自適應水印嵌入算法，主要是將水印圖像的兩次小波變換后的低頻分量潛入到原始圖像分塊經過SVD分解的S分量矩陣中，同時根據圖像的JPEG壓縮比的不同計算各個圖像塊的水印調節因子。實驗證明該算法在抗擊JPEG壓縮、中值濾波、加噪等均具有很好的魯棒性，嵌入后的圖像的PSNR達到38，具有良好的視覺掩蔽性
Abstract: Most magnetic read head data sheets do not fully specify the frequency-dependent components andare often vague when specifying other key parameters. In some cases, the specifications of two very similarheads from two different manufacturers might be quite different in terms of parameters specified and omitted.The limitations in the data sheets make designing an optimum card reading system unnecessarily difficult andtime consuming. This document outlines a strategy to overcome the above shortcomings and offers guidelinesto overcome the noise issues.
Differential Nonlinearity: Ideally, any two adjacent digitalcodes correspond to output analog voltages that are exactlyone LSB apart. Differential non-linearity is a measure of theworst case deviation from the ideal 1 LSB step. For example,a DAC with a 1.5 LSB output change for a 1 LSB digital codechange exhibits 1⁄2 LSB differential non-linearity. Differentialnon-linearity may be expressed in fractional bits or as a percentageof full scale. A differential non-linearity greater than1 LSB will lead to a non-monotonic transfer function in aDAC.Gain Error (Full Scale Error): The difference between theoutput voltage (or current) with full scale input code and theideal voltage (or current) that should exist with a full scale inputcode.Gain Temperature Coefficient (Full Scale TemperatureCoefficient): Change in gain error divided by change in temperature.Usually expressed in parts per million per degreeCelsius (ppm/°C).Integral Nonlinearity (Linearity Error): Worst case deviationfrom the line between the endpoints (zero and full scale).Can be expressed as a percentage of full scale or in fractionof an LSB.LSB (Lease-Significant Bit): In a binary coded system thisis the bit that carries the smallest value or weight. Its value isthe full scale voltage (or current) divided by 2n, where n is theresolution of the converter.Monotonicity: A monotonic function has a slope whose signdoes not change. A monotonic DAC has an output thatchanges in the same direction (or remains constant) for eachincrease in the input code. the converse is true for decreasing codes.
ANALOG INPUT BANDWIDTH is a measure of the frequencyat which the reconstructed output fundamental drops3 dB below its low frequency value for a full scale input. Thetest is performed with fIN equal to 100 kHz plus integer multiplesof fCLK. The input frequency at which the output is −3dB relative to the low frequency input signal is the full powerbandwidth.APERTURE JITTER is the variation in aperture delay fromsample to sample. Aperture jitter shows up as input noise.APERTURE DELAY See Sampling Delay.BOTTOM OFFSET is the difference between the input voltagethat just causes the output code to transition to the firstcode and the negative reference voltage. Bottom Offset isdefined as EOB = VZT–VRB, where VZT is the first code transitioninput voltage and VRB is the lower reference voltage.Note that this is different from the normal Zero Scale Error.CONVERSION LATENCY See PIPELINE DELAY.CONVERSION TIME is the time required for a completemeasurement by an analog-to-digital converter. Since theConversion Time does not include acquisition time, multiplexerset up time, or other elements of a complete conversioncycle, the conversion time may be less than theThroughput Time.DC COMMON-MODE ERROR is a specification which appliesto ADCs with differential inputs. It is the change in theoutput code that occurs when the analog voltages on the twoinputs are changed by an equal amount. It is usually expressed in LSBs.
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