Altera公司的EPLD/FPGA開發(fā)工具最新版QuartusII9.0的所有License.
標(biāo)簽： QuartusII license Altera full
上傳時(shí)間： 2013-07-09
上傳用戶：zttztt2005
The L298 is an integratedmonolithic circuit in a 15- lead Multiwatt and PowerSO20 packages. It is a
標(biāo)簽： FULL-BRIDGE DRIVER l298 DUAL
上傳時(shí)間： 2013-08-03
上傳用戶：wendy15
Many 8-bit and 16-bit microcontrollers feature 10-bitinternal ADCs. A few include 12-bit ADCs, but these oftenhave poor or nonexistent AC specifi cations, and certainlylack the performance to meet the needs of an increasingnumber of applications. The LTC®2366 and its slowerspeed versions offer a high performance alternative, asshown in the AC specifi cations in Table 1. Compare theseguaranteed specifi cations with the ADC built into yourcurrent microcontroller.
上傳時(shí)間： 2013-10-26
上傳用戶：jackandlee
The STM32F10xxx microcontroller family embeds up to three advanced 12-bit ADCs (depending on the device) with a conversion time down to 1 μs. A self-calibration feature is provided to enhance ADC accuracy versus environmental condition changes.
上傳時(shí)間： 2014-12-23
上傳用戶：eastimage
Differential Nonlinearity: Ideally, any two adjacent digitalcodes correspond to output analog voltages that are exactlyone LSB apart. Differential non-linearity is a measure of theworst case deviation from the ideal 1 LSB step. For example,a DAC with a 1.5 LSB output change for a 1 LSB digital codechange exhibits 1⁄2 LSB differential non-linearity. Differentialnon-linearity may be expressed in fractional bits or as a percentageof full scale. A differential non-linearity greater than1 LSB will lead to a non-monotonic transfer function in aDAC.Gain Error (Full Scale Error): The difference between theoutput voltage (or current) with full scale input code and theideal voltage (or current) that should exist with a full scale inputcode.Gain Temperature Coefficient (Full Scale TemperatureCoefficient): Change in gain error divided by change in temperature.Usually expressed in parts per million per degreeCelsius (ppm/°C).Integral Nonlinearity (Linearity Error): Worst case deviationfrom the line between the endpoints (zero and full scale).Can be expressed as a percentage of full scale or in fractionof an LSB.LSB (Lease-Significant Bit): In a binary coded system thisis the bit that carries the smallest value or weight. Its value isthe full scale voltage (or current) divided by 2n, where n is theresolution of the converter.Monotonicity: A monotonic function has a slope whose signdoes not change. A monotonic DAC has an output thatchanges in the same direction (or remains constant) for eachincrease in the input code. the converse is true for decreasing codes.
標(biāo)簽： Converters Defini DAC
上傳時(shí)間： 2013-10-30
上傳用戶：stvnash
ANALOG INPUT BANDWIDTH is a measure of the frequencyat which the reconstructed output fundamental drops3 dB below its low frequency value for a full scale input. Thetest is performed with fIN equal to 100 kHz plus integer multiplesof fCLK. The input frequency at which the output is −3dB relative to the low frequency input signal is the full powerbandwidth.APERTURE JITTER is the variation in aperture delay fromsample to sample. Aperture jitter shows up as input noise.APERTURE DELAY See Sampling Delay.BOTTOM OFFSET is the difference between the input voltagethat just causes the output code to transition to the firstcode and the negative reference voltage. Bottom Offset isdefined as EOB = VZT–VRB, where VZT is the first code transitioninput voltage and VRB is the lower reference voltage.Note that this is different from the normal Zero Scale Error.CONVERSION LATENCY See PIPELINE DELAY.CONVERSION TIME is the time required for a completemeasurement by an analog-to-digital converter. Since theConversion Time does not include acquisition time, multiplexerset up time, or other elements of a complete conversioncycle, the conversion time may be less than theThroughput Time.DC COMMON-MODE ERROR is a specification which appliesto ADCs with differential inputs. It is the change in theoutput code that occurs when the analog voltages on the twoinputs are changed by an equal amount. It is usually expressed in LSBs.
標(biāo)簽： Converter Defi ADC 轉(zhuǎn)換器
上傳時(shí)間： 2013-11-12
上傳用戶：pans0ul
數(shù)字與模擬電路設(shè)計(jì)技巧IC與LSI的功能大幅提升使得高壓電路與電力電路除外，幾乎所有的電路都是由半導(dǎo)體組件所構(gòu)成，雖然半導(dǎo)體組件高速、高頻化時(shí)會(huì)有EMI的困擾，不過為了充分發(fā)揮半導(dǎo)體組件應(yīng)有的性能，電路板設(shè)計(jì)與封裝技術(shù)仍具有決定性的影響。 模擬與數(shù)字技術(shù)的融合由于IC與LSI半導(dǎo)體本身的高速化，同時(shí)為了使機(jī)器達(dá)到正常動(dòng)作的目的，因此技術(shù)上的跨越競(jìng)爭(zhēng)越來越激烈。雖然構(gòu)成系統(tǒng)的電路未必有clock設(shè)計(jì)，但是毫無疑問的是系統(tǒng)的可靠度是建立在電子組件的選用、封裝技術(shù)、電路設(shè)計(jì)與成本，以及如何防止噪訊的產(chǎn)生與噪訊外漏等綜合考慮。機(jī)器小型化、高速化、多功能化使得低頻/高頻、大功率信號(hào)/小功率信號(hào)、高輸出阻抗/低輸出阻抗、大電流/小電流、模擬/數(shù)字電路，經(jīng)常出現(xiàn)在同一個(gè)高封裝密度電路板，設(shè)計(jì)者身處如此的環(huán)境必需面對(duì)前所未有的設(shè)計(jì)思維挑戰(zhàn)，例如高穩(wěn)定性電路與吵雜(noisy)性電路為鄰時(shí)，如果未將噪訊入侵高穩(wěn)定性電路的對(duì)策視為設(shè)計(jì)重點(diǎn)，事后反復(fù)的設(shè)計(jì)變更往往成為無解的夢(mèng)魘。模擬電路與高速數(shù)字電路混合設(shè)計(jì)也是如此，假設(shè)微小模擬信號(hào)增幅后再將full scale 5V的模擬信號(hào)，利用10bit A/D轉(zhuǎn)換器轉(zhuǎn)換成數(shù)字信號(hào)，由于分割幅寬祇有4.9mV，因此要正確讀取該電壓level并非易事，結(jié)果造成10bit以上的A/D轉(zhuǎn)換器面臨無法順利運(yùn)作的窘境。另一典型實(shí)例是使用示波器量測(cè)某數(shù)字電路基板兩點(diǎn)相隔10cm的ground電位，理論上ground電位應(yīng)該是零，然而實(shí)際上卻可觀測(cè)到4.9mV數(shù)倍甚至數(shù)十倍的脈沖噪訊(pulse noise)，如果該電位差是由模擬與數(shù)字混合電路的grand所造成的話，要測(cè)得4.9 mV的信號(hào)根本是不可能的事情，也就是說為了使模擬與數(shù)字混合電路順利動(dòng)作，必需在封裝與電路設(shè)計(jì)有相對(duì)的對(duì)策，尤其是數(shù)字電路switching時(shí)，ground vance noise不會(huì)入侵analogue ground的防護(hù)對(duì)策，同時(shí)還需充分檢討各電路產(chǎn)生的電流回路(route)與電流大小，依此結(jié)果排除各種可能的干擾因素。以上介紹的實(shí)例都是設(shè)計(jì)模擬與數(shù)字混合電路時(shí)經(jīng)常遇到的瓶頸，如果是設(shè)計(jì)12bit以上A/D轉(zhuǎn)換器時(shí)，它的困難度會(huì)更加復(fù)雜。
標(biāo)簽： 數(shù)字 模擬電路 設(shè)計(jì)技巧
上傳時(shí)間： 2013-11-16
上傳用戶：731140412
本文將接續(xù)介紹電源與功率電路基板，以及數(shù)字電路基板導(dǎo)線設(shè)計(jì)。寬帶與高頻電路基板導(dǎo)線設(shè)計(jì)a.輸入阻抗1MHz，平滑性(flatness)50MHz 的OP增幅器電路基板圖26 是由FET 輸入的高速OP 增幅器OPA656 構(gòu)成的高輸入阻抗OP 增幅電路，它的gain取決于R1、R2，本電路圖的電路定數(shù)為2 倍。此外為改善平滑性特別追加設(shè)置可以加大噪訊gain，抑制gain-頻率特性高頻領(lǐng)域時(shí)峰值的R3。圖26 高輸入阻抗的寬帶OP增幅電路圖27 是高輸入阻抗OP 增幅器的電路基板圖案。降低高速OP 增幅器反相輸入端子與接地之間的浮游容量非常重要，所以本電路的浮游容量設(shè)計(jì)目標(biāo)低于0.5pF。如果上述部位附著大浮游容量的話，會(huì)成為高頻領(lǐng)域的頻率特性產(chǎn)生峰值的原因，嚴(yán)重時(shí)頻率甚至?xí)驗(yàn)閒eedback 阻抗與浮游容量，造成feedback 信號(hào)的位相延遲，最后導(dǎo)致頻率特性產(chǎn)生波動(dòng)現(xiàn)象。此外高輸入阻抗OP 增幅器輸入部位的浮游容量也逐漸成為問題，圖27 的電路基板圖案的非反相輸入端子部位無full ground設(shè)計(jì)，如果有外部噪訊干擾之虞時(shí)，接地可設(shè)計(jì)成網(wǎng)格狀(mesh)。圖28 是根據(jù)圖26 制成的OP 增幅器Gain－頻率特性測(cè)試結(jié)果，由圖可知即使接近50MHz頻率特性非常平滑，-3dB cutoff頻率大約是133MHz。
標(biāo)簽： PCB
上傳時(shí)間： 2013-11-13
上傳用戶：hebanlian
We provide complete power solutions with a full lineup of power managementproducts. This brochure provides an overview of our high performance DC/DC switching regulatorcontrollers for applications including datacom, telecom, industrial, automotive, medical, avionicsand control systems. We make power design easier with our industry-leading field applicationengineering support; a broad selection of demonstration boards with schematics, layout filesand parts lists; SwitcherCAD® software for simulation, application notes and comprehensivetechnical documentation.
上傳時(shí)間： 2013-10-15
上傳用戶：lz4v4
Power over Ethernet (PoE) is a new development thatallows for the delivery of power to Ethernet-based devicesvia standard Ethernet CAT5 cable, precluding the need forwall adapters or other external power sources. The PoEspecification defines a hardware detection protocol wherePower Sourcing Equipment (PSE) is able to identify PoEPowered Devices (PDs), thus allowing full backwardscompatibility with non-PoE-aware (legacy) Ethernetdevices.
標(biāo)簽： PoE 電池電路 擴(kuò)展 以太網(wǎng)供電
上傳時(shí)間： 2013-11-11
上傳用戶：daoyue
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