Abstract: Using a DAC and a microprocessor supervisor, the system safety can be improved in industrial controllers, programmablelogiccontrollers (PLC), and data-acquisition systems. The analog output is set to zero-scale (or pin-programmable midscale) when amicroprocessor failure, optocoupler failure, or undervoltage condition occurs. A simple application is shown on how to implement thisfunction.
上傳時間： 2013-10-17
上傳用戶：sjb555
Differential Nonlinearity: Ideally, any two adjacent digitalcodes correspond to output analog voltages that are exactlyone LSB apart. Differential non-linearity is a measure of theworst case deviation from the ideal 1 LSB step. For example,a DAC with a 1.5 LSB output change for a 1 LSB digital codechange exhibits 1⁄2 LSB differential non-linearity. Differentialnon-linearity may be expressed in fractional bits or as a percentageof full scale. A differential non-linearity greater than1 LSB will lead to a non-monotonic transfer function in aDAC.Gain Error (Full Scale Error): The difference between theoutput voltage (or current) with full scale input code and theideal voltage (or current) that should exist with a full scale inputcode.Gain Temperature Coefficient (Full Scale TemperatureCoefficient): Change in gain error divided by change in temperature.Usually expressed in parts per million per degreeCelsius (ppm/°C).Integral Nonlinearity (Linearity Error): Worst case deviationfrom the line between the endpoints (zero and full scale).Can be expressed as a percentage of full scale or in fractionof an LSB.LSB (Lease-Significant Bit): In a binary coded system thisis the bit that carries the smallest value or weight. Its value isthe full scale voltage (or current) divided by 2n, where n is theresolution of the converter.Monotonicity: A monotonic function has a slope whose signdoes not change. A monotonic DAC has an output thatchanges in the same direction (or remains constant) for eachincrease in the input code. the converse is true for decreasing codes.
標簽： Converters Defini DAC
上傳時間： 2013-10-30
上傳用戶：stvnash
ANALOG INPUT BANDWIDTH is a measure of the frequencyat which the reconstructed output fundamental drops3 dB below its low frequency value for a full scale input. Thetest is performed with fIN equal to 100 kHz plus integer multiplesof fCLK. The input frequency at which the output is −3dB relative to the low frequency input signal is the full powerbandwidth.APERTURE JITTER is the variation in aperture delay fromsample to sample. Aperture jitter shows up as input noise.APERTURE DELAY See Sampling Delay.BOTTOM OFFSET is the difference between the input voltagethat just causes the output code to transition to the firstcode and the negative reference voltage. Bottom Offset isdefined as EOB = VZT–VRB, where VZT is the first code transitioninput voltage and VRB is the lower reference voltage.Note that this is different from the normal Zero Scale Error.CONVERSION LATENCY See PIPELINE DELAY.CONVERSION TIME is the time required for a completemeasurement by an analog-to-digital converter. Since theConversion Time does not include acquisition time, multiplexerset up time, or other elements of a complete conversioncycle, the conversion time may be less than theThroughput Time.DC COMMON-MODE ERROR is a specification which appliesto ADCs with differential inputs. It is the change in theoutput code that occurs when the analog voltages on the twoinputs are changed by an equal amount. It is usually expressed in LSBs.
上傳時間： 2013-11-12
上傳用戶：pans0ul
數字與模擬電路設計技巧IC與LSI的功能大幅提升使得高壓電路與電力電路除外，幾乎所有的電路都是由半導體組件所構成，雖然半導體組件高速、高頻化時會有EMI的困擾，不過為了充分發揮半導體組件應有的性能，電路板設計與封裝技術仍具有決定性的影響。 模擬與數字技術的融合由于IC與LSI半導體本身的高速化，同時為了使機器達到正常動作的目的，因此技術上的跨越競爭越來越激烈。雖然構成系統的電路未必有clock設計，但是毫無疑問的是系統的可靠度是建立在電子組件的選用、封裝技術、電路設計與成本，以及如何防止噪訊的產生與噪訊外漏等綜合考慮。機器小型化、高速化、多功能化使得低頻/高頻、大功率信號/小功率信號、高輸出阻抗/低輸出阻抗、大電流/小電流、模擬/數字電路，經常出現在同一個高封裝密度電路板，設計者身處如此的環境必需面對前所未有的設計思維挑戰，例如高穩定性電路與吵雜(noisy)性電路為鄰時，如果未將噪訊入侵高穩定性電路的對策視為設計重點，事后反復的設計變更往往成為無解的夢魘。模擬電路與高速數字電路混合設計也是如此，假設微小模擬信號增幅后再將full scale 5V的模擬信號，利用10bit A/D轉換器轉換成數字信號，由于分割幅寬祇有4.9mV，因此要正確讀取該電壓level并非易事，結果造成10bit以上的A/D轉換器面臨無法順利運作的窘境。另一典型實例是使用示波器量測某數字電路基板兩點相隔10cm的ground電位，理論上ground電位應該是零，然而實際上卻可觀測到4.9mV數倍甚至數十倍的脈沖噪訊(pulse noise)，如果該電位差是由模擬與數字混合電路的grand所造成的話，要測得4.9 mV的信號根本是不可能的事情，也就是說為了使模擬與數字混合電路順利動作，必需在封裝與電路設計有相對的對策，尤其是數字電路switching時，ground vance noise不會入侵analogue ground的防護對策，同時還需充分檢討各電路產生的電流回路(route)與電流大小，依此結果排除各種可能的干擾因素。以上介紹的實例都是設計模擬與數字混合電路時經常遇到的瓶頸，如果是設計12bit以上A/D轉換器時，它的困難度會更加復雜。
上傳時間： 2013-11-16
上傳用戶：731140412
為深入了解基于UC3854A控制的PFC變換器中的動力學特性，研究系統參數變化對變換器中分岔現象的影響，在建立Boost PFC變換器雙閉環數學模型的基礎上，用Matlab軟件對變換器中慢時標分岔及混沌等不穩定現象進行了仿真。在對PFC變換器中慢時標分岔現象仿真的基礎上，分析了系統參數變化對分岔點的影響，并進行了仿真驗證。仿真結果清晰地顯示了輸入整流電壓的幅值變化對系統分岔點的影響。 Abstract: In order to better understand the dynamics characteristic of power factor correction converter based on UC3854A， and make the way that parameters change influences the bifurcation phenomena of the system clearly. The math model of the two closed loop circuits to the Boost PFC （Power Factor Correction） converter controller was built. Then， with the help of Matlab， the simulation for nonlinear phenomena such as chaos and slow-scale bifurcation in the PFC converter was made. Finally the factors that have influence to the phenomenon of bifurcation under slow-scale in PFC converter were analyzed. The simulation results clearly show the parameters change influences the bifurcation point of the system.
上傳時間： 2013-10-17
上傳用戶：杜瑩12345
Introduction to Xilinx Packaging Electronic packages are interconnectable housings for semiconductor devices. The major functions of the electronic packages are to provide electrical interconnections between the IC and the board and to efficiently remove heat generated by the device. Feature sizes are constantly shrinking, resulting in increased number of transistors being packed into the device. Today's submicron technology is also enabling large-scale functional integration and system-on-a-chip solutions. In order to keep pace with these new advancements in silicon technologies, semiconductor packages have also evolved to provide improved device functionality and performance. Feature size at the device level is driving package feature sizes down to the design rules of the early transistors. To meet these demands, electronic packages must be flexible to address high pin counts, reduced pitch and form factor requirements. At the same time,packages must be reliable and cost effective.
上傳時間： 2013-10-22
上傳用戶：ztj182002
Agilent AN 154 S-Parameter Design Application Note S參數的設計與應用 The need for new high-frequency, solid-state circuitdesign techniques has been recognized both by microwaveengineers and circuit designers. These engineersare being asked to design solid state circuitsthat will operate at higher and higher frequencies.The development of microwave transistors andAgilent Technologies’ network analysis instrumentationsystems that permit complete network characterizationin the microwave frequency rangehave greatly assisted these engineers in their work.The Agilent Microwave Division’s lab staff hasdeveloped a high frequency circuit design seminarto assist their counterparts in R&D labs throughoutthe world. This seminar has been presentedin a number of locations in the United States andEurope.From the experience gained in presenting this originalseminar, we have developed a four-part videotape, S-Parameter Design Seminar. While the technologyof high frequency circuit design is everchanging, the concepts upon which this technologyhas been built are relatively invariant.The content of the S-Parameter Design Seminar isas follows:
標簽： S參數
上傳時間： 2013-12-19
上傳用戶：aa54
Introduction to Xilinx Packaging Electronic packages are interconnectable housings for semiconductor devices. The major functions of the electronic packages are to provide electrical interconnections between the IC and the board and to efficiently remove heat generated by the device. Feature sizes are constantly shrinking, resulting in increased number of transistors being packed into the device. Today's submicron technology is also enabling large-scale functional integration and system-on-a-chip solutions. In order to keep pace with these new advancements in silicon technologies, semiconductor packages have also evolved to provide improved device functionality and performance. Feature size at the device level is driving package feature sizes down to the design rules of the early transistors. To meet these demands, electronic packages must be flexible to address high pin counts, reduced pitch and form factor requirements. At the same time,packages must be reliable and cost effective.
上傳時間： 2013-11-21
上傳用戶：不懂夜的黑
數字與模擬電路設計技巧IC與LSI的功能大幅提升使得高壓電路與電力電路除外，幾乎所有的電路都是由半導體組件所構成，雖然半導體組件高速、高頻化時會有EMI的困擾，不過為了充分發揮半導體組件應有的性能，電路板設計與封裝技術仍具有決定性的影響。 模擬與數字技術的融合由于IC與LSI半導體本身的高速化，同時為了使機器達到正常動作的目的，因此技術上的跨越競爭越來越激烈。雖然構成系統的電路未必有clock設計，但是毫無疑問的是系統的可靠度是建立在電子組件的選用、封裝技術、電路設計與成本，以及如何防止噪訊的產生與噪訊外漏等綜合考慮。機器小型化、高速化、多功能化使得低頻/高頻、大功率信號/小功率信號、高輸出阻抗/低輸出阻抗、大電流/小電流、模擬/數字電路，經常出現在同一個高封裝密度電路板，設計者身處如此的環境必需面對前所未有的設計思維挑戰，例如高穩定性電路與吵雜(noisy)性電路為鄰時，如果未將噪訊入侵高穩定性電路的對策視為設計重點，事后反復的設計變更往往成為無解的夢魘。模擬電路與高速數字電路混合設計也是如此，假設微小模擬信號增幅后再將full scale 5V的模擬信號，利用10bit A/D轉換器轉換成數字信號，由于分割幅寬祇有4.9mV，因此要正確讀取該電壓level并非易事，結果造成10bit以上的A/D轉換器面臨無法順利運作的窘境。另一典型實例是使用示波器量測某數字電路基板兩點相隔10cm的ground電位，理論上ground電位應該是零，然而實際上卻可觀測到4.9mV數倍甚至數十倍的脈沖噪訊(pulse noise)，如果該電位差是由模擬與數字混合電路的grand所造成的話，要測得4.9 mV的信號根本是不可能的事情，也就是說為了使模擬與數字混合電路順利動作，必需在封裝與電路設計有相對的對策，尤其是數字電路switching時，ground vance noise不會入侵analogue ground的防護對策，同時還需充分檢討各電路產生的電流回路(route)與電流大小，依此結果排除各種可能的干擾因素。以上介紹的實例都是設計模擬與數字混合電路時經常遇到的瓶頸，如果是設計12bit以上A/D轉換器時，它的困難度會更加復雜。
上傳時間： 2014-02-12
上傳用戶：wenyuoo
Semiconductor memory, card readers, microprocessors,disc drives, piezoelectric devices and digitally based systemsfurnish transient loads that a voltage regulator mustservice. Ideally, regulator output is invariant during a loadtransient. In practice, some variation is encountered andbecomes problematic if allowable operating voltage tolerancesare exceeded. This mandates testing the regulatorand its associated support components to verify desiredperformance under transient loading conditions. Variousmethods are employable to generate transient loads, allowingobservation of regulator response
上傳時間： 2013-11-21
上傳用戶：semi1981
